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Combinational equivalence checking using satisfiability and recursive learning
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Source Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe table of contents
Munich, Germany
Article No. 33  
Year of Publication: 1999
ISBN:1-58113-121-6
Authors
João Marques-Silva  Instituto Superior Técnico, Cadence European Labs/INESC, Lisboa, Portugal
Thomas Glass  Siemens AG, Corporate Technology, Munich, Germany
Sponsor
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 3,   Downloads (12 Months): 24,   Citation Count: 10
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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[1] R. Bayardo Jr. and R. Schrag, "Using CSP Look-Back Techniques to Solve Real-World SAT Instances," in Proc. of the Nat'l Conf. on Artificial Intelligence, pp. 203-208, July 1997.
 
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[2] C. L. Berman and L. H. Trevillyan, "Functional Comparison of Logic Designs for VLSI Circuits," in Proc. of the Int'l Conf. on Computer-Aided Design, pp. 456-459, November 1989.
 
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[7] G. Janssen, The Eindhoven BDD Package, Eindhoven University of Technology. (URL: ftp://ftp.ics.ele.tue.nl/pub/users/geert/ bdd.tar.gz.)
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[11] T. Larrabee, "Test Pattern Generation Using Boolean Satisfiability," IEEE Trans. on Computer-Aided Design, vol. 11, no. 1, pp. 4-15, January 1992.
 
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[12] S. Malik, A. R. Wang, R. K. Brayton and A. Sangiovanni-Vincentelli, "Logic Verification Using Binary Decision Diagrams in a Logic Synthesis Environment", in Proc. of the Int'l Conf. e on Computer-Aided Design, pp. 6-9, November 1988.
 
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[14] J. Marques-Silva, "Improving Satisfiability Algorithms by Using Recursive Learning," in International Workshop on Boolean Problems , September 1998.
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[19] P. Stephan, R.K. Brayton and A.L. Sangiovanni-Vincentelli, "Combinatorial Test Generation Using Satisfiability", IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, vol. 15, no. 9, Sep. 1996.
 
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CITED BY  10

Collaborative Colleagues:
João Marques-Silva: colleagues
Thomas Glass: colleagues