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Cramér-von Mises variance estimators for simulations
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Source Winter Simulation Conference archive
Proceedings of the 23rd conference on Winter simulation table of contents
Phoenix, Arizona, United States
Pages: 916 - 920  
Year of Publication: 1991
ISBN:0-7803-0181-1
Authors
David Goldsman  School of Industrial & Systems Engineering, Georgia Institute of Technology, Atlanta, Georgia
Keebom Kang  Department of Administrative Sciences, Naval Postgraduate School, Monterey, California
Andrew F. Seila  Dept. of Management Sciences & Information Technology, University of Georgia, Athens, Georgia
Sponsors
IIE : Institute of Industrial Engineers
SCS : Society for Computer Simulation
ASA : American Statistical Association
NIST : National Institue of Standards & Technology
ACM: Association for Computing Machinery
IEEE-CS : Computer Society
IEEE-SMCS : Systems, Man & Cybernetics Society
ORSA : Operations Research Society of America
SIGSIM: ACM Special Interest Group on Simulation and Modeling
TIMS :
Publisher
IEEE Computer Society  Washington, DC, USA
Bibliometrics
Downloads (6 Weeks): 4,   Downloads (12 Months): 11,   Citation Count: 1
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
Anderson, T. W., and D. A. Darling. 1952. Asymptotic theory of certain 'goodness of fit' criteria ba~ed on stochastic processes. Annals of Maghemagical Statistics 23, 193-212.
 
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3
Cram~r, H. 1928. On the composition of elementary errors. Second paper: statisticM applications. Skand. Aktuartidskr. 11,141-180.
 
4
Durbin, J. 1973. Distribution Theory for Tests Based on the Sample Distribnlion Fnnction. Philadelphia: Society for industrial and Applied Mathematics.
 
5
Dzhaparidze, K. 1986. Parameter Estimation and Hypothesis Testing in Spectral Analysis of Stationary Time Series, New York: Springer-Verlag.
 
6
Foley, R. D., and D. Goldsman. 1990. Confidence intervals using orthonormally weighted standardized time series. Technical Report, School of Industrial and Systems Engineering, Georgia Institute of Technology, Atlanta, Georgia.
 
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Goldsman, D., K. Kang, and A. F. Seila. 1991. Cram(~r-von Mises variance estimators for simulations. Technical Report, School of Industrial and Systems Engineering, Georgia Institute of Technology, Atlanta, Georgia.
 
9
Goldsman, D., and M. S. Meketon. 1990. A comparison of several variance estimators. Technical Report, School of Industrial and Systems Engineering, Georgia Institute of Technology, Atlanta, Georgia.
 
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12
Schmeiser, B. W., and W.-M. Song. 1989. Optimal mean-squared-error batch sizes. Technical Report, School of Industrial Engineering, Purdue University, West Lafayette, Indiana.
 
13
Schruben, L. 1983. Confidence interval estimation using standardized time series. Operations Research 31, 1090-1108.
 
14
Smirnov, N. V. 1937. On the distribution of the von Mises w2-criterion (in Russian). Matem Sbornik. 5, 973-993.
 
15
yon Mises, R. 1931. Wahrscheinlichkeitsrechnung. Leipzig" Wein.
 
16
Watson, G. S. 1961. Goodness-of-fit tests on a circle. Biometrika 48, 109-114.


Collaborative Colleagues:
David Goldsman: colleagues
Keebom Kang: colleagues
Andrew F. Seila: colleagues