| Residual test coverage monitoring |
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International Conference on Software Engineering
archive
Proceedings of the 21st international conference on Software engineering
table of contents
Los Angeles, California, United States
Pages: 277 - 284
Year of Publication: 1999
ISBN:1-58113-074-0
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Authors
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Christina Pavlopoulou
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Purdue University, Electrical and Computer Engineering, West Lafayette, Indiana
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Michal Young
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University of Oregon, Computer Science Department, Eugene, Oregon
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| Bibliometrics |
Downloads (6 Weeks): 13, Downloads (12 Months): 39, Citation Count: 26
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REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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[doi> 10.1145/174675.175935]
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H. Lee. Bit: Bytecode.instrumenting tool. Master's thesis, University of Colorado, 1997.
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Christina Pavlopoulou. Residual coverage monitoring of java programs. Master's thesis, Purdue University, 1998.
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Ted Romer, Geoff Voelker, Dennis Lee, Alec Wolman, Wayne Wong, Hank Levy, and Brian Bershad. Instrumentation and optimization of 'Win32/Intel executables using Etch. In Proceedings of the USENIX Windows NT Workshop, pages 1-7, August 1997.
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CITED BY 26
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William Dickinson , David Leon , Andy Podgurski, Finding failures by cluster analysis of execution profiles, Proceedings of the 23rd International Conference on Software Engineering, p.339-348, May 12-19, 2001, Toronto, Ontario, Canada
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Jonathan Misurda , James A. Clause , Juliya L. Reed , Bruce R. Childers , Mary Lou Soffa, Demand-driven structural testing with dynamic instrumentation, Proceedings of the 27th international conference on Software engineering, May 15-21, 2005, St. Louis, MO, USA
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Murali Haran , Alan Karr , Michael Last , Alessandro Orso , Adam A. Porter , Ashish Sanil , Sandro Fouche, Techniques for Classifying Executions of Deployed Software to Support Software Engineering Tasks, IEEE Transactions on Software Engineering, v.33 n.5, p.287-304, May 2007
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