ACM Home Page
Please provide us with feedback. Feedback
Area efficient architectures for information integrity in cache memories
Full text PdfPdf (227 KB)
Source International Symposium on Computer Architecture archive
Proceedings of the 26th annual international symposium on Computer architecture table of contents
Atlanta, Georgia, United States
Pages: 246 - 255  
Year of Publication: 1999
ISBN:0-7695-0170-2
Also published in ...
Authors
Seongwoo Kim  Department of Electrical and Computer Engineering, Iowa State University, Ames, IA
Arun K. Somani  Department of Electrical and Computer Engineering, Iowa State University, Ames, IA
Sponsors
IEEE-CS\TCCA : TC on Computer Arhitecture
SIGARCH: ACM Special Interest Group on Computer Architecture
Publisher
IEEE Computer Society  Washington, DC, USA
Bibliometrics
Downloads (6 Weeks): 6,   Downloads (12 Months): 38,   Citation Count: 17
Additional Information:

abstract   references   cited by   index terms   collaborative colleagues  

Tools and Actions: Review this Article  
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/300979.301000
What is a DOI?

ABSTRACT

Information integrity in cache memories is a fundamental requirement for dependable computing. Conventional architectures for enhancing cache reliability using check codes make it difficult to trade between the level of data integrity and the chip area requirement. We focus on transient fault tolerance in primary cache memories and develop new architectural solutions, to maximize fault coverage when the budgeted silicon area is not sufficient for the conventional configuration of an error checking code. The underlying idea is to exploit the corollary of reference locality in the organization and management of the code. A higher protection priority is dynamically assigned to the portions of the cache that are more error-prone and have a higher probability of access. The error-prone likelihood prediction is based on the access frequency. We evaluate the effectiveness of the proposed schemes using a trace-driven simulation combined with software error injection using four different fault manifestation models. From the simulation results, we show that for most benchmarks the proposed architectures are effective and area efficient for increasing the cache integrity under all four models.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
2
 
3
 
4
 
5
 
6
 
7
J.M. Mulder. N. T. Quach, and M. J. Flynn. An area model for on-chip memories and its application. IEEE J. Solid- State Circuits, 26:98-106, February I991.
 
8
S. Park and B. Bose. Burst asymmetric/unidirectional error correcting/detecting codes. Proc. Int'l Syrup. Fault-Tolerant Computing, pages 273-280, June 1990.
 
9
D. Patterson, T. Anderson, N. Cardwell, R. Formm, K. Keeton, K. Kozyrakis, R. Thomas, and K. Yelick. Intelligent RAM (IRAM): Chips that remember and compute. Proc. Int'l Syrup. Solid-State Circuits, pages 224-225, February 1997.
 
10
J.C. Picket and J. T. B. Jr. Cosmic ray induced error in MOS memory cells. IEEE Trans. Nuclear Science, NS-25:1166- 1171, December 1978.
 
11
A. M. Saleh. Reliability of scrubbing recovery-techniques for memory systems. IEEE Trans. Reliability, 30(1):114-- 122, April ! 990,
 
12
 
13
 
14
 
15
P. Sweazey. SRAM organization, control, and speed, and their effect on cache memory design. Midcon/87, pages 434.--437, September 1987.
 
16
URL:. http: //www. specbench, org.

CITED BY  17

Collaborative Colleagues:
Seongwoo Kim: colleagues
Arun K. Somani: colleagues