| Area efficient architectures for information integrity in cache memories |
| Full text |
Pdf
(227 KB)
|
| Source
|
International Symposium on Computer Architecture
archive
Proceedings of the 26th annual international symposium on Computer architecture
table of contents
Atlanta, Georgia, United States
Pages: 246 - 255
Year of Publication: 1999
ISBN:0-7695-0170-2
Also published in ...
|
|
Authors
|
|
Seongwoo Kim
|
Department of Electrical and Computer Engineering, Iowa State University, Ames, IA
|
|
Arun K. Somani
|
Department of Electrical and Computer Engineering, Iowa State University, Ames, IA
|
|
| Sponsors |
|
| Publisher |
IEEE Computer Society
Washington, DC, USA
|
| Bibliometrics |
Downloads (6 Weeks): 6, Downloads (12 Months): 38, Citation Count: 17
|
|
|
ABSTRACT
Information integrity in cache memories is a fundamental requirement for dependable computing. Conventional architectures for enhancing cache reliability using check codes make it difficult to trade between the level of data integrity and the chip area requirement. We focus on transient fault tolerance in primary cache memories and develop new architectural solutions, to maximize fault coverage when the budgeted silicon area is not sufficient for the conventional configuration of an error checking code. The underlying idea is to exploit the corollary of reference locality in the organization and management of the code. A higher protection priority is dynamically assigned to the portions of the cache that are more error-prone and have a higher probability of access. The error-prone likelihood prediction is based on the access frequency. We evaluate the effectiveness of the proposed schemes using a trace-driven simulation combined with software error injection using four different fault manifestation models. From the simulation results, we show that for most benchmarks the proposed architectures are effective and area efficient for increasing the cache integrity under all four models.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
| |
1
|
|
 |
2
|
|
| |
3
|
|
| |
4
|
|
| |
5
|
|
| |
6
|
Johan Karlsson , Peter Liden , Peter Dahlgren , Rolf Johansson , Ulf Gunneflo, Using Heavy-Ion Radiation to Validate Fault-Handling Mechanisms, IEEE Micro, v.14 n.1, p.8-11, 13-23, February 1994
[doi> 10.1109/40.259894]
|
| |
7
|
J.M. Mulder. N. T. Quach, and M. J. Flynn. An area model for on-chip memories and its application. IEEE J. Solid- State Circuits, 26:98-106, February I991.
|
| |
8
|
S. Park and B. Bose. Burst asymmetric/unidirectional error correcting/detecting codes. Proc. Int'l Syrup. Fault-Tolerant Computing, pages 273-280, June 1990.
|
| |
9
|
D. Patterson, T. Anderson, N. Cardwell, R. Formm, K. Keeton, K. Kozyrakis, R. Thomas, and K. Yelick. Intelligent RAM (IRAM): Chips that remember and compute. Proc. Int'l Syrup. Solid-State Circuits, pages 224-225, February 1997.
|
| |
10
|
J.C. Picket and J. T. B. Jr. Cosmic ray induced error in MOS memory cells. IEEE Trans. Nuclear Science, NS-25:1166- 1171, December 1978.
|
| |
11
|
A. M. Saleh. Reliability of scrubbing recovery-techniques for memory systems. IEEE Trans. Reliability, 30(1):114-- 122, April ! 990,
|
| |
12
|
|
| |
13
|
|
| |
14
|
|
| |
15
|
P. Sweazey. SRAM organization, control, and speed, and their effect on cache memory design. Midcon/87, pages 434.--437, September 1987.
|
| |
16
|
URL:. http: //www. specbench, org.
|
CITED BY 17
|
|
Lin Li , Vijay Degalahal , N. Vijaykrishnan , Mahmut Kandemir , Mary Jane Irwin, Soft error and energy consumption interactions: a data cache perspective, Proceedings of the 2004 international symposium on Low power electronics and design, August 09-11, 2004, Newport Beach, California, USA
|
|
|
W. Zhang , M. Kandemir , A. Sivasubramaniam , M. J. Irwin, Performance, energy, and reliability tradeoffs in replicating hot cache lines, Proceedings of the 2003 international conference on Compilers, architecture and synthesis for embedded systems, October 30-November 01, 2003, San Jose, California, USA
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
Yuan Cai , Marcus T. Schmitz , Alireza Ejlali , Bashir M. Al-Hashimi , Sudhakar M. Reddy, Cache size selection for performance, energy and reliability of time-constrained systems, Proceedings of the 2006 conference on Asia South Pacific design automation, January 24-27, 2006, Yokohama, Japan
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
Hossein Asadi , Vilas Sridharan , Mehdi B. Tahoori , David Kaeli, Vulnerability analysis of L2 cache elements to single event upsets, Proceedings of the conference on Design, automation and test in Europe: Proceedings, March 06-10, 2006, Munich, Germany
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|