|
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
| |
1
|
M. N. Ozisik, Douauv~y v~ue r~om~ii,.~ o~ rse~ ~oudition," New York NY:Dover, 1908.
|
| |
2
|
M. Huang, F. Romeo, and A. Sangiovani-Vincentell "An efficient general cooling schedule for simulated annealing," Proc. Int. Con/. Computer-Aided Design, pp. 381-384, Nov. 1986.
|
| |
3
|
M. D. Osterman and M. Pecht, "Component Placemeat for Reliability on Conductively Cooled Printed Wiring Boards," ASME J. of Packaging, 111(3):149-
|
| |
4
|
R. Darveaux, I. Turlik, L. T. Hwang, and A. Reisman, "Thermal Stress Analysis of a Multichip Package Design," IEEE ~ns. Comp. , Hybrids, Manufaet. Technol., pp. 663-672, Dec. 1989.
|
| |
5
|
M. D. Osterman and M. Pecht, "Placement for Reliability and Routability of Convectively Cooled PWBs," IEEE Trans. on CAD, 9(7):734-744, Jul. 1990.
|
| |
6
|
N. K. Verghese and D. J. Allstot, "Rapid Simulation of substrate coupling effects in mixed-mode IC's," Proc. IEEECustom Integrated Circuits Conf., pp. 18.3.1- 18.3.4, 1993.
|
| |
7
|
B. R. Stanisic, N. K. Verghese, R. A. Rutenbar, L. R. Carley and D. J. Allstot, "Addressing Substrate Coupling in Mixed-Mode IC's: Simulation and Power Tempe~ture values for ~ruct Temperature valuta for strud Distribution Synthesis," IEEE J. of Solid-State Circuits, vol. 29, no. 3, pp. 226-237, M~. 1994.
|
| |
8
|
S. Mitra, R. A. Rutenbar, L. R. Carley and D. J. A!lstot, "Substrate-Aware Mixed-Signal Macrocell Placement in WB2GHT," IEEE J. of Solid.State Circuits, vol. 30, no. 3, pp. 269-278, Mar. 1995.
|
| |
9
|
|
| |
10
|
I. L. Wemple and A. T. Yang, "Integrated Circuit Substrate Coupling Models Based on Voronoi Tessellation," IEEE 2~'ans. on CAD, 14(12):1459--1469, Dec. 1995.
|
 |
11
|
Yi-Kan Cheng , Chin-Chi Teng , Abhijit Dharchoudhury , Elyse Rosenbaum , Sung-Mo Kang, ICET: a complete chip-level thermal reliability diagnosis tool for CMOS VLSI chips, Proceedings of the 33rd annual conference on Design automation, p.548-551, June 03-07, 1996, Las Vegas, Nevada, United States
[doi> 10.1145/240518.240622]
|
 |
12
|
|
| |
13
|
Y. K. Cheng, P. Raha, C. C. Teng, E. Rosenbaum, and S.-M. Kang, "ILLIADS-T: An Electrothermal Timing Simulator for Temperature-Sensitive Reliability Diagnosis of CMOS VLSI Chips," IEEE Trans. on CAD, Vol. 17, No. 8, pp. 668-681, Aug. 1998.
|
 |
14
|
|
CITED BY 9
|
|
Shamik Das , Anantha Chandrakasan , Rafael Reif, Timing, energy, and thermal performance of three-dimensional integrated circuits, Proceedings of the 14th ACM Great Lakes symposium on VLSI, April 26-28, 2004, Boston, MA, USA
|
|
|
Aditya Bansal , Mesut Meterelliyoz , Siddharth Singh , Jung Hwan Choi , Jayathi Murthy , Kaushik Roy, Compact thermal models for estimation of temperature-dependent power/performance in FinFET technology, Proceedings of the 2006 conference on Asia South Pacific design automation, January 24-27, 2006, Yokohama, Japan
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|