A comparison of regression, neural net, and pattern recognition approaches to IR

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A comparison of regression, neural net, and pattern recognition approaches to IR

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Conference on Information and Knowledge Management archive
Proceedings of the seventh international conference on Information and knowledge management table of contents

Bethesda, Maryland, United States

Pages: 140 - 147

Year of Publication: 1998

ISBN:1-58113-061-9

Author

Aitao Chen

School of Information Management and Systems, 102 South Hall, University of California at Berkeley, CA

Sponsors

SIGIR: ACM Special Interest Group on Information Retrieval
SIGMIS: ACM Special Interest Group on Management Information Systems

Publisher

ACM New York, NY, USA

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Downloads (6 Weeks): 4, Downloads (12 Months): 26, Citation Count: 1

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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