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Getting to the bottom of deep submicron
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Source International Conference on Computer Aided Design archive
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design table of contents
San Jose, California, United States
Pages: 203 - 211  
Year of Publication: 1998
ISBN:1-58113-008-2
Authors
Dennis Sylvester  University of California, Berkeley Electrical Engineering and Computer Sciences
Kurt Keutzer  University of California, Berkeley Electrical Engineering and Computer Sciences
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CS : Computer Society
IEEE-EDS : Electronic Devices Society
IEEE-CAS : Circuits & Systems
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 10,   Downloads (12 Months): 42,   Citation Count: 87
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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11
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D. Sylvester, C. Hu, O.S. Nakagawa, and S-x\: Oh, "Interconnect scaling: signal integrity and performance in future high-speed CMOS designs," Proc. of I, ZSI Symposium on Technolog), pp. 42-3, 1998.
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CITED BY  87

Collaborative Colleagues:
Dennis Sylvester: colleagues
Kurt Keutzer: colleagues