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High-level design validation and test
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Source International Conference on Computer Aided Design archive
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design table of contents
San Jose, California, United States
Page: 3  
Year of Publication: 1998
ISBN:1-58113-008-2
Authors
Sujit Dey  University of California at San Diego, La Jolla, CA
Jacob Abraham  University of Texas, Austin, TX
Yervant Zorian  Logic Vision, Inc., San Jose, CA
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CS : Computer Society
IEEE-EDS : Electronic Devices Society
IEEE-CAS : Circuits & Systems
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 1,   Downloads (12 Months): 8,   Citation Count: 0
Additional Information:

index terms   collaborative colleagues  

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DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/288548.288550
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INDEX TERMS

Primary Classification:
  B. Hardware
  B.8 Performance and Reliability

Additional Classification:
  J. Computer Applications


General Terms:
Design, Performance, Theory, Verification

Collaborative Colleagues:
Sujit Dey: colleagues
Jacob Abraham: colleagues
Yervant Zorian: colleagues

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