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Estimation of standby leakage power in CMOS circuits considering accurate modeling of transistor stacks
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Source International Symposium on Low Power Electronics and Design archive
Proceedings of the 1998 international symposium on Low power electronics and design table of contents
Monterey, California, United States
Pages: 239 - 244  
Year of Publication: 1998
ISBN:1-58113-059-7
Authors
Zhanping Chen  School of Electrical and Computer Engineering, Purdue Univ., W. Lafa yette, IN
Mark Johnson  School of Electrical and Computer Engineering, Purdue Univ., W. Lafa yette, IN
Liqiong Wei  School of Electrical and Computer Engineering, Purdue Univ., W. Lafa yette, IN
Kaushik Roy  School of Electrical and Computer Engineering, Purdue Univ., W. Lafa yette, IN
Sponsors
IEEE-SSCS : Solid Stat Circuits Council
SIGDA: ACM Special Interest Group on Design Automation
IEEE-EDS : Electronic Devices Society
IEEE-CAS : Circuits & Systems
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 27,   Downloads (12 Months): 123,   Citation Count: 54
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ABSTRACT

Low supply voltage requires the device threshold to be reduced in order to maintain performance. Due to the exponential relationship between leakage current and threshold voltage in the weak inversion region, leakage power can no longer be ignored. In this paper we present a technique to accurately estimate leakage power by accurately modeling the leakage current in transistor stacks. The standby leakage current model has been verified by IISPICE. We demonstrate that the dependence of leakage power on primary input combinations can be accounted for by this model. Based on our analysis we can determine good bounds for leakage power in the standby mode. As a by-product of this analysis, we can also determine the set of input vectors which can put the circuits in the low-power standby mode. Results on a large number of benchmarks indicate that proper input selection can reduce the standby leakage power by more than 50% for some circuits.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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CITED BY  54

Collaborative Colleagues:
Zhanping Chen: colleagues
Mark Johnson: colleagues
Liqiong Wei: colleagues
Kaushik Roy: colleagues