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Optimizing the DRAM refresh count for merged DRAM/logic LSIs
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Source International Symposium on Low Power Electronics and Design archive
Proceedings of the 1998 international symposium on Low power electronics and design table of contents
Monterey, California, United States
Pages: 82 - 87  
Year of Publication: 1998
ISBN:1-58113-059-7
Authors
Taku Ohsawa  Department of Computer Scince and Communication Engineering Kyushu University 6-1 Kasuga-Koen, Kasuga, Fukuoka, 816-8580, Japan
Koji Kai  Institute of Systems & Information Technologies/KYUSHU, 2-1-22-707 Momochihama, Sawara-ku, Fukuoka 814-0001, Japan
Kazuaki Murakami  Department of Computer Scince and Communication Engineering Kyushu University 6-1 Kasuga-Koen, Kasuga, Fukuoka, 816-8580, Japan
Sponsors
IEEE-SSCS : Solid Stat Circuits Council
SIGDA: ACM Special Interest Group on Design Automation
IEEE-EDS : Electronic Devices Society
IEEE-CAS : Circuits & Systems
Publisher
ACM  New York, NY, USA
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ABSTRACT

In merged DRAM/logic LSIs, the DRAM portion could suffer from shorter data retention time because of heat and noise caused by the logic portion. Frequent refreshes increase power consumption. Also, they disturb normal DRAM accesses leading to performance degradation. In order to overcome this problem, we propose several DRAM refresh architectures. The basic idea is to eliminate unnecessary DRAM refreshes. We have estimated the DRAM refresh count in executing benchmark programs under several architecture models. As a result, in the most effective combination of the architectures, we have obtained more than 80% reduction against a conventional DRAM refresh architecture for most benchmark programs. In addition to it, even when we have taken normal DRAM access into account, we have obtained more than 50% reduction for several benchmarks.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
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3
K. Kai, A.Inoue, T. Ohsawa, and K. Murakami. "Analyzing and Reducing the Impact of Shorter Data Retention Time on the Performance of Merged DRAM/Logic LSIs". To appear in IEICE Transactions on Electronics, E81-C(9), September 1998.
 
4
K. Kai, T. Ohsawa, and K. Murakami. "A DRAM Refresh Architecture for Merged DRAM/Logic LSIs'. Technical Report ICD97-77, IEICE, July 1997.
 
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T. Ohsawa, K. Kai, and K. Murakami. "Evaluating DRAM Refresh Architectures for Merged DRAM/Logic LSIs". To appear in IEICE Transactions on Electronics, E81-C(9), September 1998.
 
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Collaborative Colleagues:
Taku Ohsawa: colleagues
Koji Kai: colleagues
Kazuaki Murakami: colleagues