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Figures of merit to characterize the importance of on-chip inductance
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 35th annual Design Automation Conference table of contents
San Francisco, California, United States
Pages: 560 - 565  
Year of Publication: 1998
ISBN:0-89791-964-5
Authors
Yehea I. Ismail  Department of Electrical Engineering, University of Rochester, Rochester, New York
Eby G. Friedman  Department of Electrical Engineering, University of Rochester, Rochester, New York
Jose L. Neves  IBM Microelectronics, 1580 Route 52, East Fishkill, New York
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
EDAC : Electronic Design Automation Consortium
IEEE-CS : Computer Society
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 6,   Downloads (12 Months): 29,   Citation Count: 22
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ABSTRACT

A closed form solution for the output signal of a CMOS inverter driving an RLC transmission line is presented. This solution is based on the alpha power law for deep submicrometer technologies. Two figures of merit are presented that are useful for determining if a section of interconnect should be modeled as either an RLC or an RC impedance. The damping factor of a lumped RLC circuit is shown to be a useful figure of merit. The second useful figure of merit considered in this paper is the ratio of the rise time of the input signal at the driver of an interconnect line to the time of flight of the signals across the line. AS/X circuit simulations of an RLC transmission line and a five section RC II circuit based on a 0.25 µm IBM CMOS technology are used to quantify and determine the relative accuracy of an RC model. One primary result of this study is evidence demonstrating that a range for the length of the interconnect exists for which inductance effects are prominent. Furthermore, it is shown that under certain conditions, inductance effects are negligible despite the length of the section of interconnect.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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CITED BY  22

Collaborative Colleagues:
Yehea I. Ismail: colleagues
Eby G. Friedman: colleagues
Jose L. Neves: colleagues