ACM Home Page
Please provide us with feedback. Feedback
Adjoint transient sensitivity computation in piecewise linear simulation
Full text PdfPdf (342 KB)
Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 35th annual Design Automation Conference table of contents
San Francisco, California, United States
Pages: 477 - 482  
Year of Publication: 1998
ISBN:0-89791-964-5
Authors
Tuyan V. Nguyen  IBM Austin Research Laboratory, Austin, TX
Anirudh Devgan  IBM Austin Research Laboratory, Austin, TX
Ognen J. Nastov  Dept. of EE & CS, MIT, Cambridge, MA
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
EDAC : Electronic Design Automation Consortium
IEEE-CS : Computer Society
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 1,   Downloads (12 Months): 14,   Citation Count: 2
Additional Information:

abstract   references   cited by   index terms   collaborative colleagues  

Tools and Actions: Request Permissions Request Permissions    Review this Article  
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/277044.277177
What is a DOI?

ABSTRACT

This paper presents a general method for computing transient sensitivities using the adjoint method in event driven simulation algorithms that employ piecewise linear device models. Sensitivity information provides first order assessment of circuit variability with respect to design variables and parasitics. This information is particularly useful for noise stability analysis, timing rule generation, and circuit optimization. Techniques for incorporating adjoint transient sensitivity into ACES, a general piecewise linear simulator, are presented. Sensitivity computation includes algorithms to handle instantaneous charge redistribution due to the discontinuous conductance models of the piecewise linear elements, and the loss of simulation accuracy due to the non-monotonous responses in autonomous adjoint circuits with non-zero initial conditions. Results demonstrate the efficiency and accuracy of the proposed techniques.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
A. Devgan and R. A. Rohrer. "Adaptively Controlled Explicit Simulation,'* IEEE Trans. Computer-Aided Design. Val. 13. pp. 746-762, June 1994.
 
2
S.W. Director and R. A. Rohrer. "The Generalized Adjoint Network and Network Sensitivities." ZEEE Tran. Circuit Theory, vol. 16, pp. 3 18-323. August 1969.
 
3
D.A. Hocevar, P, Yang. T. N. Trick, and B. D. Epler. "Transient Sensitivity Computation for MOSFET Circuits."IEEE Trans. Computer-Aided Design, vol. 4, pp. 609-620, Oct. 1985.
 
4
P. Feldmann. T. V. Nguyen, S. W. Director. and R. A. Rohrer, "Sensitivity Computation in Piecewise Approximate Circuit Simulation," IEEE Trans. Computer-Aided Design, vol. 10. pp. 171-183, Feb. 1991.
 
5
C-J Chen and W-S Feng, "Relaxation-Based Transient Sensitivity Computation for MOSFET Circuits,.' IEEE Trans. Computer-AidedDe, ign, vol. 14. pp. 173-185, Feb. 1995.
 
6
T.V. Nguyen. P. Feldmann, S. W. Director. and R. A. Rohrer. "SPECS Simulation Validation with Efficient Transient Sensitivity Computation." Proc. ICCAD, 1989, pp. 252-255.


Collaborative Colleagues:
Tuyan V. Nguyen: colleagues
Anirudh Devgan: colleagues
Ognen J. Nastov: colleagues