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Tools and methodology for RF IC design
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 35th annual Design Automation Conference table of contents
San Francisco, California, United States
Pages: 414 - 420  
Year of Publication: 1998
ISBN:0-89791-964-5
Authors
Al Dunlop  Bell Laboratories, Murray Hill, NJ
Alper Demir  Bell Laboratories, Murray Hill, NJ
Peter Feldmann  Bell Laboratories, Murray Hill, NJ
Sharad Kapur  Bell Laboratories, Murray Hill, NJ
David Long  Bell Laboratories, Murray Hill, NJ
Robert Melville  Bell Laboratories, Murray Hill, NJ
Jaijeet Roychowdhury  Bell Laboratories, Murray Hill, NJ
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
EDAC : Electronic Design Automation Consortium
IEEE-CS : Computer Society
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 4,   Downloads (12 Months): 15,   Citation Count: 4
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ABSTRACT

We describe powerful new techniques for the analysis of RF circuits. Next-generation CAD tools based on such techniques should enable RF designers to obtain a more accurate picture of how their circuits will operate. These new simulation capabilities will be essential in order to reduce the number of design iterations needed to produce complex RFICs.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Al Dunlop: colleagues
Alper Demir: colleagues
Peter Feldmann: colleagues
Sharad Kapur: colleagues
David Long: colleagues
Robert Melville: colleagues
Jaijeet Roychowdhury: colleagues