| A mixed nodal-mesh formulation for efficient extraction and passive reduced-order modeling of 3D interconnects |
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Annual ACM IEEE Design Automation Conference
archive
Proceedings of the 35th annual Design Automation Conference
table of contents
San Francisco, California, United States
Pages: 297 - 302
Year of Publication: 1998
ISBN:0-89791-964-5
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Authors
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Nuno Marques
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INESC/Cadence European Laboratories, Dept. of Elect. and Comp. Eng, Instituto Superior Técnico 1000 Lisboa, Portugal
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Mattan Kamon
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Research Laboratory of Electronics, Dept. of Elect. Eng. and Comp. Science, Massachusetts Institute of Technology, Cambridge, MA
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Jacob White
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Research Laboratory of Electronics, Dept. of Elect. Eng. and Comp. Science, Massachusetts Institute of Technology, Cambridge, MA
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L. Miguel Silveira
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INESC/Cadence European Laboratories, Dept. of Elect. and Comp. Eng, Instituto Superior Técnico 1000 Lisboa, Portugal
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Downloads (6 Weeks): 2, Downloads (12 Months): 19, Citation Count: 6
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ABSTRACT
As VLSI circuit speeds have increased, reliable chip and system design can no longer be performed without accurate three-dimensional interconnect models. In this paper, we describe an integral equation aproach to modeling the impedance of inter-connect structures accounting for both the charge accumulation on the surface of conductors and the current traveling in their interior: Our formulation, based on a combination of nodal and mesh analysis, has the required properties to be combined with Model Order Reduction techniques to generate accurate and guaranteed passive low order Interconnect models for efficient inclusion in standard circuit simulators. Furthermore, the formulation is shown to be more flexible and efficient than previously reported methods.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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L. Miguel Silveira , Mattan Kamon , Jacob White, Efficient reduced-order modeling of frequency-dependent coupling inductances associated with 3-D interconnect structures, Proceedings of the 32nd ACM/IEEE conference on Design automation, p.376-380, June 12-16, 1995, San Francisco, California, United States
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Mattan Kamon , Nuno Marques , Jacob White, FastPep: a fast parasitic extraction program for complex three-dimensional geometries, Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design, p.456-460, November 09-13, 1997, San Jose, California, United States
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Mattan Kamon, Nuno Marques, L. Miguel Silveira, and Jacob K. White. Generating reduced order models via peec for capturing skin and proximity effects. In Proc. IEEE 6th Topical Meeting on Electrical Performance of Electronic Packaging, Monterey, CA, San Jose, California, October 1997.
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CITED BY 6
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Jing-Rebecca Li , Frank Wang , Jacob K. White, An efficient Lyapunov equation-based approach for generating reduced-order models of interconnect, Proceedings of the 36th ACM/IEEE conference on Design automation, p.1-6, June 21-25, 1999, New Orleans, Louisiana, United States
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Xin Hu , Jung Hoon Lee , Jacob White , Luca Daniel, Analysis of full-wave conductor system impedance over substrate using novel integration techniques, Proceedings of the 42nd annual conference on Design automation, June 13-17, 2005, San Diego, California, USA
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