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A mixed nodal-mesh formulation for efficient extraction and passive reduced-order modeling of 3D interconnects
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 35th annual Design Automation Conference table of contents
San Francisco, California, United States
Pages: 297 - 302  
Year of Publication: 1998
ISBN:0-89791-964-5
Authors
Nuno Marques  INESC/Cadence European Laboratories, Dept. of Elect. and Comp. Eng, Instituto Superior Técnico 1000 Lisboa, Portugal
Mattan Kamon  Research Laboratory of Electronics, Dept. of Elect. Eng. and Comp. Science, Massachusetts Institute of Technology, Cambridge, MA
Jacob White  Research Laboratory of Electronics, Dept. of Elect. Eng. and Comp. Science, Massachusetts Institute of Technology, Cambridge, MA
L. Miguel Silveira  INESC/Cadence European Laboratories, Dept. of Elect. and Comp. Eng, Instituto Superior Técnico 1000 Lisboa, Portugal
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
EDAC : Electronic Design Automation Consortium
IEEE-CS : Computer Society
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 2,   Downloads (12 Months): 19,   Citation Count: 6
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ABSTRACT

As VLSI circuit speeds have increased, reliable chip and system design can no longer be performed without accurate three-dimensional interconnect models. In this paper, we describe an integral equation aproach to modeling the impedance of inter-connect structures accounting for both the charge accumulation on the surface of conductors and the current traveling in their interior: Our formulation, based on a combination of nodal and mesh analysis, has the required properties to be combined with Model Order Reduction techniques to generate accurate and guaranteed passive low order Interconnect models for efficient inclusion in standard circuit simulators. Furthermore, the formulation is shown to be more flexible and efficient than previously reported methods.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Mattan Kamon, Nuno Marques, L. Miguel Silveira, and Jacob K. White. Generating reduced order models via peec for capturing skin and proximity effects. In Proc. IEEE 6th Topical Meeting on Electrical Performance of Electronic Packaging, Monterey, CA, San Jose, California, October 1997.
 
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CITED BY  6

Collaborative Colleagues:
Nuno Marques: colleagues
Mattan Kamon: colleagues
Jacob White: colleagues
L. Miguel Silveira: colleagues