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Using reconfigurable computing techniques to accelerate problems in the CAD domain: a case study with Boolean satisfiability
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 35th annual Design Automation Conference table of contents
San Francisco, California, United States
Pages: 194 - 199  
Year of Publication: 1998
ISBN:0-89791-964-5
Authors
Peixin Zhong  Princeton University and NEC CCRL
Pranav Ashar  Princeton University and NEC CCRL
Sharad Malik  Princeton University and NEC CCRL
Margaret Martonosi  Princeton University and NEC CCRL
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
EDAC : Electronic Design Automation Consortium
IEEE-CS : Computer Society
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 3,   Downloads (12 Months): 13,   Citation Count: 8
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ABSTRACT

The Boolean satisfiability problem lies at the core of several CAD applications, including automatic test pattern generation and logic synthesis. This paper describes and evaluates an approach for accelerating Boolean satisfiability using configurable hardware. Our approach harnesses the increasing speed and capacity of field-programmable gate arrays by tailoring the SAT-solver circuit to the particular formula being solved. This input-specific technique gets high performance due both to (i) a direct mapping of Boolean operations to logic gates, and (ii) large amounts of fine-grain parallelism in the implication processing. Overall, these strategies yields impressive speedups (>200X in many cases) compared to current software approaches, and they require only modest amounts of hardware. In a broader sense, this paper alerts the hardware design community to the increasing importance of input-specific designs, and documents their promise via a quantitative study of input-specific SAT solving.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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P. Stephan, R. Brayton, 8nd A. Sangiovanni-Vincentelli. Combinational Test Generation Using $atisfiabilitlt. Department of Electrical Engineering 8nd Computer Sciences, University of California at Berkeley, 1992. UCB/ERL Memo M92/112.
 
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Xillnx Corp. The Programmable Logic Data Book. Xilinx Corp. San Jose, CA, 1996.

CITED BY  8

Collaborative Colleagues:
Peixin Zhong: colleagues
Pranav Ashar: colleagues
Sharad Malik: colleagues
Margaret Martonosi: colleagues