| Analysis, reduction and avoidance of crosstalk on VLSI chips |
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International Symposium on Physical Design
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Proceedings of the 1998 international symposium on Physical design
table of contents
Monterey, California, United States
Pages: 211 - 218
Year of Publication: 1998
ISBN:1-58113-021-X
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Authors
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Tilmann Stöhr
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IBM Entwicklung GmbH, Schönaicher Straβe 220, 71032 Böblingen, Germany
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Markus Alt
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IBM Entwicklung GmbH, Schönaicher Straβe 220, 71032 Böblingen, Germany
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Asmus Hetzel
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IBM Entwicklung GmbH, Schönaicher Straβe 220, 71032 Böblingen, Germany
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Jürgen Koehl
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IBM Entwicklung GmbH, Schönaicher Straβe 220, 71032 Böblingen, Germany
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Downloads (6 Weeks): 17, Downloads (12 Months): 36, Citation Count: 9
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ABSTRACT
As chip size and design density increase, coupling effects (crosstalk) between signal wires become increasingly critical to on-chip timing and even functionality. A method is presented to analyze crosstalk while taking into account timing relationship and timing criticality between coupling wires. The method is based upon the geometrical layout of the wires (adjacency), the signal slopes on the wires (circuit driving capability) and timing considerations.
Based on these wire characteristics, a pattern driven routing tool imbeds the crosstalk critical nets in non-adjacent wiring tracks for crosstalk avoidance. The pattern driven routing capability may also be used for rerouting crosstalk critical nets of an already existing routing for crosstalk reduction.
The crosstalk analysis and the routing tool described in this paper were used in three generations of VLSI processor chip designs for IBM's S/390 computers, always resulting in crosstalk-resistant hardware.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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CITED BY 9
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Mattias Ringe , Thomas Lindenkreuz , Erich Barke, Static timing analysis taking crosstallk into account, Proceedings of the conference on Design, automation and test in Europe, p.451-457, March 27-30, 2000, Paris, France
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Bernard N. Sheehan, Predicting coupled noise in RC circuits by matching 1, 2, and 3 moments, Proceedings of the 37th conference on Design automation, p.532-535, June 05-09, 2000, Los Angeles, California, United States
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