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ABSTRACT
We describe a novel iterationless approach for computing the effective capacitance of an interconnect load at a driving gate output. Our new approach is considerably faster than previous methods for computing effective capacitance, with little or no loss of accuracy. Thus, the approach is suitable within the analysis loop for performance-driven iterative layout optimization. After reviewing previous gate load models and effective capacitance approximations, we separately derive our method for the cases of step and ramp waveform at the gate output, and note on-going extensions for the case of complex gates (e.g., channel-connected components). Experimental results using the new effective capacitance approach show that our resulting delay estimates are quite accurate — within 15% of IISPICE-computed delays on data corresponding to an 0.25µm microprocessor design.
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CITED BY 5
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Jing-Jia Liou , Angela Krstic , Kwang-Ting Cheng , Deb Aditya Mukherjee , Sandip Kundu, Performance sensitivity analysis using statistical method and its applications to delay, Proceedings of the 2000 conference on Asia South Pacific design automation, p.587-592, January 2000, Yokohama, Japan
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Muzhou Shao , Martin D. F. Wong , Huijing Cao , Youxin Gao , Li-Pen Yuan , Li-Da Huang , Seokjin Lee, Explicit gate delay model for timing evaluation, Proceedings of the 2003 international symposium on Physical design, April 06-09, 2003, Monterey, CA, USA
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