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ABSTRACT
Noise analysis and avoidance is an increasingly critical step in deep submicron design. Ever increasing requirements on performance have led to widespread use of dynamic logic circuit families and its other derivatives. These aggressive circuit families trade off noise margin for timing performance making them more susceptible to noise failure and increasing the need for noise analysis. Currently, noise analysis is performed either through circuit or timing simulation or through model order reduction. These techniques in use are still inefficient for analyzing massive amount of interconnect data found in present day integrated circuits. This paper presents efficient techniques for estimation of coupled noise in on-chip interconnects. This noise estimation metric is an upper bound for RC circuits, being similar in spirit to Elmore delay in timing analysis. Such an efficient noise metric is especially useful for noise criticality pruning and physical design based noise avoidance techniques.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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CITED BY 29
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Lun Ye , Foong-Charn Chang , Peter Feldmann , Nagaraj Ns , Rakesh Chadha , Frank Cano, Chip-level verification for parasitic coupling effects in deep-submicron digital designs, Proceedings of the conference on Design, automation and test in Europe, p.128-es, January 1999, Munich, Germany
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INDEX TERMS
Primary Classification:
C.
Computer Systems Organization
C.1
PROCESSOR ARCHITECTURES
C.1.2
Multiple Data Stream Architectures (Multiprocessors)
Subjects:
Interconnection architectures (e.g., common bus, multiport memory, crossbar switch)
Additional Classification:
B.
Hardware
B.7
INTEGRATED CIRCUITS
C.
Computer Systems Organization
General Terms:
Design,
Measurement,
Performance,
Theory
Keywords:
Elmore delay,
circuit simulation,
coupled noise estimation,
deep submicron design,
dynamic logic circuit families,
integrated circuit noise,
noise analysis,
noise criticality pruning,
on-chip interconnects,
physical design based noise avoidance,
timing simulation
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