A scheme for integrated controller-datapath fault testing

ABSTRACT

In systems consisting of interacting datapaths and controllersand utilizing built-in self test (BIST), the datapaths andcontrollers are traditionally tested separately by isolatingeach component from the environment of the system duringtest.This work facilitates the testing of datapath-controllerpairs in an integrated fashion.The key to the approach isthe addition of logic to the system that interacts with theexisting controller to push the effects of controller faults intothe data flow, so that they can be observed at the datapathregisters rather than directly at the controller outputs.Theresult is to reduce the BIST overhead over what is neededif the datapath and controller are tested independently, andto allow a more complete test of the interface between datapathand controller.Fault coverage and overhead resultsare given for four example circuits.

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INDEX TERMS

Primary Classification:
  B. Hardware
  B.7 INTEGRATED CIRCUITS
      B.7.3 Reliability and Testing**
          Subjects: Built-in tests**

Additional Classification:
  B. Hardware
  B.4 INPUT/OUTPUT AND DATA COMMUNICATIONS
      B.4.2 Input/Output Devices
          Subjects: Channels and controllers

  C. Computer Systems Organization

General Terms:
Design, Experimentation, Measurement, Performance, Reliability, Theory