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Statistical estimation of the cumulative distribution function for power dissipation in VLSI cirucits
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 34th annual Design Automation Conference table of contents
Anaheim, California, United States
Pages: 371 - 376  
Year of Publication: 1997
ISBN:0-89791-920-3
Authors
Chih-Shun Ding  Rockwell Semiconductor Systems, Rockwell International Corporation, Newport Beach, CA
Qing Wu  Department of Electrical Engineering Systems, University of Southern California, Los Angeles, CA
Chen-Ta Hsieh  Department of Electrical Engineering Systems, University of Southern California, Los Angeles, CA
Massoud Pedram  Department of Electrical Engineering Systems, University of Southern California, Los Angeles, CA
Sponsors
EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 8,   Downloads (12 Months): 26,   Citation Count: 8
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ABSTRACT

This paper proposes to use quantile points of the cumulative distributionfunction for power consumption to provide detailed informationabout the power distribution in a circuit. The paper also presentstwo techniques based on population pruning and stratification to improvethe efficiency of estimation. Both population pruning and stratificationare based on a lowcost predictor, such as zero-delay powerestimate. Experimental results show the effectiveness of the proposedtechniques in providing detailed power distribution information.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
C. M. Huizer. Power dissipation analysis of CMOS VLSI circuits by means of switch-level simulation. In IEEE European Solid State Circuits Conf., pages 61- 64, 1990.
 
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11
C.-S. Ding, Q. Wu, and M. Pedram. Statistical estimation of distribution of power dissipation in vlsi circuits. Technical Report CENG 97-09, Electrical Engineering-Systems Department, University of Southern California, March 1997.
 
12
Q. Wu, C.-S. Ding, C.-T. Hsieh, and M. Pedram. Statistical design of macromodels for rt-level power evaluation. In Proc. of ASP-DAC97, January 1997.
 
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R.L. Scheaffer, W. Mendenhall, and L .Ott. Elementrary sulwey sampling. PWS- KENT Publishing Company, 1995.

CITED BY  8

Collaborative Colleagues:
Chih-Shun Ding: colleagues
Qing Wu: colleagues
Chen-Ta Hsieh: colleagues
Massoud Pedram: colleagues