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Equivalence checking using cuts and heaps
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 34th annual Design Automation Conference table of contents
Anaheim, California, United States
Pages: 263 - 268  
Year of Publication: 1997
ISBN:0-89791-920-3
Authors
Andreas Kuehlmann  IBM Thomas J. Watson Research Center, Yorktown Heights, NY
Florian Krohm  IBM Thomas J. Watson Research Center, Yorktown Heights, NY
Sponsors
EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 4,   Downloads (12 Months): 41,   Citation Count: 47
Additional Information:

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ABSTRACT

This paper presents a verification technique which isspecifically targeted to formally comparing large combinational circuits with some structural similarities. The approach combines the application of BDDs withcircuit graph hashing, automatic insertion of multiple cut frontiers, and a controlled elimination of false negative verification results caused by the cuts. Twoideas fundamentally distinguish the presented technique from previous approaches. First, originating from the cut frontiers, multiple BDDs are computedfor the internal nets of the circuit, and second, theBDD propagation is prioritized by size and discontinued once a given limit is exceeded.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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G. L. Smith, R. J. Bahnsen, and H. Halliwell, "Boolean comparison of hardware and flowcharts," IBM Journal of Research and Development, vol. 26, pp. 106-116, January 1982.
 
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C. L. Berman and L. H. Trevillyan, "Functional comparison of logic designs for VLSI circuits," in Digest of Technical Papers of the IEEE International Conference on Computer-Aided Design, pp. 456-459, IEEE, November 1989.
 
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CITED BY  47

Collaborative Colleagues:
Andreas Kuehlmann: colleagues
Florian Krohm: colleagues