A flexible statistical model for CAD of submicrometer analog CMOS integrated circuits

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A flexible statistical model for CAD of submicrometer analog CMOS integrated circuits

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International Conference on Computer Aided Design archive
Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design table of contents

Santa Clara, California, United States

Pages: 330 - 333

Year of Publication: 1993

ISBN:0-8186-4490-7

Authors

Christopher Michael	National Semiconductor, 2900 Semiconductor Drive, Santa Clara, CA
Christopher Abel	Department of Electrical Engineering, The Ohio State University, Columbus, OH
C. S. Teng	National Semiconductor, 2900 Semiconductor Drive, Santa Clara, CA

Sponsors

IEEE-CS : Computer Society
SIGDA: ACM Special Interest Group on Design Automation

Publisher

IEEE Computer Society Press Los Alamitos, CA, USA

Bibliometrics

Downloads (6 Weeks): 1, Downloads (12 Months): 9, Citation Count: 2

Additional Information:

references cited by collaborative colleagues

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

	1	J. P. Spoto, W. T. Coston, and C. P. Hernazldez, "Statistical integrated circuit design and characterization," IEEE Transactions on Computer - Asded Dessgn, vol. CAD - 5, pp. 90 - 103, January 1986.
	2	S.R. Nassif, A. J. Strojwas, and S. W. Director, "FABRICS II: A statistically based IC fabrication process simulator," IEEE Transactions on Computer- Asded Design, vol. CAD- 3, pp. 40 -46, January 1984
	3	C. Michael and M. Ismail, "Statistical modeling of device mismatch for analog MOS integrated circuits," IEEE Journal of Sohd-State C~rcu~ts, vol. SC- 27, pp. 154 - 166, February 1992.
	4	Christopher Michael , Mohammed I. Ismail, Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits, Kluwer Academic Publishers, Norwell, MA, 1993
	5	C. Abel, C. Michael, C. Teng, M. Ismaal, and R. Lahri, "Characterization of transistor mismatch for statistical cad of submicron cmos analog circuits," in Proceedings of the IEEE International Symposium on C~rcu,ts and Systems, pp. 1401-1404, 1993.
	6	Bernhard Flury, Common principal components & related multivariate models, John Wiley & Sons, Inc., New York, NY, 1988
	7	J. Chen and M. Styblinski, "A systematic approach for statistical modeling and its application to cmos circuits," in Proceedings of the IEEE International Symposzum on C,rcuits and Systems, pp. 1805-1808, 1993.
	8	M. J. M. Pelgrom, A. C. J. Duinmaiger, and A. P. G. Welbets, "Matching properties of MOS transistors for precision analog design," IEEE Journal of Sohd-State Circuzts, vol. SC - 24, pp. 1433- 1439, October 1989

CITED BY 2

	G. Biagetti , S. Orcioni , L. Signoracci , C. Turchetti , P. Crippa , M. Alessandrini, SiSMA: a statistical simulator for mismatch analysis of MOS ICs, Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design, p.490-496, November 10-14, 2002, San Jose, California
	Massimo Conti , Paolo Crippa , Simone Orcioni , Marcello Pesare , Claudio Turchetti , Loris Vendrame , Silvia Lucherini, An Integrated CAD Methodology for Yield Enhancement of VLSI CMOS Circuits Including Statistical Device Variations, Analog Integrated Circuits and Signal Processing, v.37 n.2, p.85-102, November 2003

Collaborative Colleagues:

Christopher Michael: colleagues

Christopher Abel: colleagues

C. S. Teng: colleagues

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