Fault behavior dictionary for simulation of device-level transients

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Fault behavior dictionary for simulation of device-level transients

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International Conference on Computer Aided Design archive
Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design table of contents

Santa Clara, California, United States

Pages: 6 - 9

Year of Publication: 1993

ISBN:0-8186-4490-7

Authors

Gwan S. Choi	Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, 1308 W. Mafn St., Urbana, IL
Ravishankar K. Iyer	Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, 1308 W. Mafn St., Urbana, IL
Daniel G. Saab	Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, 1308 W. Mafn St., Urbana, IL

Sponsors

IEEE-CS : Computer Society
SIGDA: ACM Special Interest Group on Design Automation

Publisher

IEEE Computer Society Press Los Alamitos, CA, USA

Bibliometrics

Downloads (6 Weeks): 2, Downloads (12 Months): 8, Citation Count: 2

Additional Information:

references cited by collaborative colleagues

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

	Abramovici90	M. Abramovici, M. Breuer, A. Friedman, Digital Systems Testing and Testable Design, New York: Computer Science Press, 1990.
	Choi92	G. S. Choi , R. K. Iyer, FOCUS: An Experimental Environment for Fault Sensitivity Analysis, IEEE Transactions on Computers, v.41 n.12, p.1515-1526, December 1992 [doi>10.1109/12.214660]
	Choi93	G. Choi, R. lyer, D. Saab, Fast Transient Simulation, CRHC Tech. Rpt., Univ. of II1., July 1993.
	Courtois79	B. Courtois, Some results about the' efficiency of simple mechanisms for the detection of microcomputer malfunctions, Digest, FTCS-9, pp. 71-74, June 1979.
	Evans91	Richard J. Evans, Detecting Bridging Faults In CMOS Circuits, Ph.D. Thesis, University of Oxford, 1991.
	Hammersley64	J. Hammersley, D. Handscomb, Monte Carlo Methods, Methuen, London, 1964.
	Iyer86	Ravishankar K. Iyer , David J. Rossetti, A measurement-based model for workload dependence of CPU errors, IEEE Transactions on Computers, v.35 n.6, p.511-519, June 1986 [doi>10.1109/TC.1986.5009428]
	Lomelino86	O. Lomelino and R. lyer, Error propagation in a digital avionic processor: a simulation.based study, Prec. Real Time Systems Symposium, pp. 218-225, Dec. 1986.
	Motorola86	CORPORATE Motorola, Inc., M68000 family programmer's reference manual, Motorola Inc., Phoenix, AZ, 1991
	Nagel75	L. W. Nagel, SPICE2: a computer program to simulate semiconductor circuits, ERL Memo ERL-M520, University of California, Berkeley, May 1975.
	Saab90	D. G. Saab , R. B. Mueller Thuns , D. Blaauw , J. T. Rahmeh , J. A. Abraham, Hierarchical multi-level fault simulation of large systems, Journal of Electronic Testing: Theory and Applications, v.1 n.2, p.139-149, May 1990 [doi>10.1007/BF00137390]
	Siewiorek78	D. Siewiorek, V. Kini, H. Mashburn, S. McConnel, M. Tsao, A Case Study of C.mmp, Cm*, and C.vmp: Part I-- Experiences with Fault Tolerance in Multiprocessor Systems, Proceedings of the IEEE, Vol 66 No. 10, October 1978, pages 1178-1199.
	Tang90	D. Tang, R.K. lyer and S.S. Subramani, Failure Analysis and Modeling of a VAX Cluster System, Proceedings, 20th International Symposium on Fault Tolerant Computing, Neweastle-upon-Tyne, United Kingdom, ,June 26-28, 1990.

CITED BY 2

	Shuo Chen , Jun Xu , Zbigniew Kalbarczyk , Ravishankar K. Iyer , Keith Whisnant, Modeling and evaluating the security threats of transient errors in firewall software, Performance Evaluation, v.56 n.1-4, p.53-72, March 2004
	Gabriela Jacques-Silva , Jim Challenger , Lou Degenaro , James Giles , Rohit Wagle, Self healing in System-S, Cluster Computing, v.11 n.3, p.247-257, September 2008

Collaborative Colleagues:

Gwan S. Choi: colleagues

Ravishankar K. Iyer: colleagues

Daniel G. Saab: colleagues

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