Modeling the effects of temporal proximity of input transitions on gate propagation delay and transition time

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Modeling the effects of temporal proximity of input transitions on gate propagation delay and transition time

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Annual ACM IEEE Design Automation Conference archive
Proceedings of the 33rd annual Design Automation Conference table of contents

Las Vegas, Nevada, United States

Pages: 617 - 622

Year of Publication: 1996

ISBN:0-89791-779-0

Authors

V. Chandramouli	Department of Electrical Engineering and Computer Science, University of Michigan
Karem A. Sakallah	Department of Electrical Engineering and Computer Science, University of Michigan

Sponsors

IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
EDAC : Electronic Design Automation Consortium

Publisher

ACM New York, NY, USA

Bibliometrics

Downloads (6 Weeks): 2, Downloads (12 Months): 16, Citation Count: 14

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references cited by index terms collaborative colleagues

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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CITED BY 14

	Aseem Agarwal , Florentin Dartu , David Blaauw, Statistical gate delay model considering multiple input switching, Proceedings of the 41st annual conference on Design automation, June 07-11, 2004, San Diego, CA, USA
	Chirayu Amin , Chandramouli Kashyap , Noel Menezes , Kip Killpack , Eli Chiprout, A multi-port current source model for multiple-input switching effects in CMOS library cells, Proceedings of the 43rd annual conference on Design automation, July 24-28, 2006, San Francisco, CA, USA
	Liang-Chi Chen , Sandeep K. Gupta , Melvin A. Breuer, TA-PSV—Timing Analysis for Partially Specified Vectors, Journal of Electronic Testing: Theory and Applications, v.18 n.1, p.73-88, February 2002
	Liang-Chi Chen , Sandeep K. Gupta , Melvin A. Breuer, A new gate delay model for simultaneous switching and its applications, Proceedings of the 38th conference on Design automation, p.289-294, June 2001, Las Vegas, Nevada, United States
	Chandramouli Kashyap , Chirayu Amin , Noel Menezes , Eli Chiprout, A nonlinear cell macromodel for digital applications, Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design, November 05-08, 2007, San Jose, California
	Kenneth S. Stevens , Florentin Dartu, Algorithms for MIS vector generation and pruning, Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design, November 05-09, 2006, San Jose, California
	Leonard Lee , Li-C. Wang, On bounding the delay of a critical path, Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design, November 05-09, 2006, San Jose, California
	D. Sinha , Hai Zhou, A unified framework for statistical timing analysis with coupling and multiple input switching, Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design, p.837-843, November 06-10, 2005, San Jose, CA
	V. Chandramouli , Karem A. Sakallah, Selection of Voltage Thresholds for Delay Measurement, Analog Integrated Circuits and Signal Processing, v.14 n.1-2, p.9-28, Sept. 1997
	Alessandra Nardi , Haibo Zeng , Joshua L. Garrett , Luca Daniel , Alberto L. Sangiovanni-Vincentelli, A Methodology for the Computation of an Upper Bound on Nose Current Spectrum of CMOS Switching Activity, Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design, p.778, November 09-13, 2003
	Takayuki Fukuoka , Akira Tsuchiya , Hidetoshi Onodera, Statistical gate delay model for multiple input switching, Proceedings of the 2008 conference on Asia and South Pacific design automation, January 21-24, 2008, Seoul, Korea
	Rajeshwary Tayade , Sani Nassif , Jacob Abraham, Analytical model for the impact of multiple input switching noise on timing, Proceedings of the 2008 conference on Asia and South Pacific design automation, January 21-24, 2008, Seoul, Korea
	Noel Menezes , Chandramouli Kashyap , Chirayu Amin, A "true" electrical cell model for timing, noise, and power grid verification, Proceedings of the 45th annual conference on Design automation, June 08-13, 2008, Anaheim, California
	Amit Goel , Sarma Vrudhula, Current source based standard cell model for accurate signal integrity and timing analysis, Proceedings of the conference on Design, automation and test in Europe, March 10-14, 2008, Munich, Germany