Fast parameters extraction of general three-dimension interconnects using geometry independent measured equation of invariance

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Fast parameters extraction of general three-dimension interconnects using geometry independent measured equation of invariance

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Annual ACM IEEE Design Automation Conference archive
Proceedings of the 33rd annual Design Automation Conference table of contents

Las Vegas, Nevada, United States

Pages: 371 - 376

Year of Publication: 1996

ISBN:0-89791-779-0

Authors

Weikai Sun	Board of Studies in Computer Engineering, University of California, Santa Cruz, CA
Wayne Wei-Ming Dai	Board of Studies in Computer Engineering, University of California, Santa Cruz, CA
Wei Hong	Dept. of Radio Eng., Southeast Uni., Nanjing, PRC

Sponsors

IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
EDAC : Electronic Design Automation Consortium

Publisher

ACM New York, NY, USA

Bibliometrics

Downloads (6 Weeks): 5, Downloads (12 Months): 11, Citation Count: 4

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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	3	A. Zemainian and R. Tewarson, "Three dimensional capacitance computations for VLSI/ULSI interconnections," IEEE Tran. on CAD, vol. CAD-8, pp. 1319-1326, December 1989.
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	6	K. Mei, R. Pous, Z. Chen, and Y. Liu, "The measured equation of invariance: A new concept in field computation," in IEEE AP-S, Digest, pp. 2047-2050, July 1992.
	7	Y. Li, Z. J. Cendes, and X. Yuan, "A modified mei method for solving scattering problems with the finite element method," in IEEE AP-S, Digest, pp. 284- 287, July 1993.
	8	W. Hong, Y. Liu, and K. Mei, "Application of the measured equation of invariance to solve scattering problems invovling penetrable medium," Radio Science, April 1994.
	9	W. Hong and K. Mei, "Application of the measured equation of invariance to the scattering problem of an anisotropic medium cylinder," in IEEE AP-S, Seattle, June 1994.
	10	Wei Hong , Weikai Sun , Wayne Wei-Ming Dai, Fast Parameters Extraction of Multilayer and Multiconductor Interconnects Using Geometry Independent Measured Equation of Invariance, Proceedings of the 1996 IEEE Multi-Chip Module Conference (MCMC '96), p.105, February 06-07, 1996
	11	J. O. Jevtic and R. Lee, "A theoretical and numerical analysis of the measured equation invariance," IEEE Trans. on AP, pp. 1097-1105, August 1994.
	12	J. O. Jevtic and R. Lee, "How invariance is the measured equation invariance," IEEE Microwave and Guided Wave Letters, pp. 45-47, February 1995.
	13	Wei Hong , Weikai Sun , Wayne W Dai, ON THE INVARIANCE OF MEASURED EQUATION OF INVARIANCE, University of California at Santa Cruz, Santa Cruz, CA, 1995
	14	M. D. Prouty, Application of the Mes~tared Eq~tation of Invariance to Planar Microstrip Structures. PhD thesis, University of California at Berkeley, 1994.
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CITED BY 4

	Eileen You , Lakshminarasimh Varadadesikan , John MacDonald , Wieze Xie, A practical approach to parasitic extraction for design of multimillion-transistor integrated circuits, Proceedings of the 37th conference on Design automation, p.69-74, June 05-09, 2000, Los Angeles, California, United States
	Weiping Shi , Jianguo Liu , Naveen Kakani , Tiejun Yu, A fast hierarchical algorithm for 3-D capacitance extraction, Proceedings of the 35th annual conference on Design automation, p.212-217, June 15-19, 1998, San Francisco, California, United States
	Wei Hong , Weikai Sun , Zhenhai Zhu , Hao Ji , Ben Song , Wayne Wei-Ming Dai, A novel dimension reduction technique for the capacitance extraction of 3D VLSI interconnects, Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design, p.381-386, November 10-14, 1996, San Jose, California, United States
	N. P. van der Meijs , T. Smedes, Accurate interconnect modeling: towards multi-million transistor chips as microwave circuits, Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design, p.244-251, November 10-14, 1996, San Jose, California, United States