Application of a Markov model to the measurement, simulation, and diagnosis of an iterative design process

Subscribe (Full Service)


	Search: The ACM Digital Library The Guide

	Feedback

Application of a Markov model to the measurement, simulation, and diagnosis of an iterative design process

Full text

Pdf (47 KB)

Source

Annual ACM IEEE Design Automation Conference archive
Proceedings of the 33rd annual Design Automation Conference table of contents

Las Vegas, Nevada, United States

Pages: 185 - 188

Year of Publication: 1996

ISBN:0-89791-779-0

Authors

Eric W. Johnson	Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN
Luis A. Castillo	Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN
Jay B. Brockman	Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN

Sponsors

IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
EDAC : Electronic Design Automation Consortium

Publisher

ACM New York, NY, USA

Bibliometrics

Downloads (6 Weeks): 4, Downloads (12 Months): 15, Citation Count: 2

Additional Information:

references cited by index terms collaborative colleagues

Tools and Actions:	Request Permissions Review this Article Save this Article to a Binder Display Formats: BibTeX EndNote ACM Ref

DOI Bookmark:	Use this link to bookmark this Article: http://doi.acm.org/10.1145/240518.240553 What is a DOI?

REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

	1	K. O. ten Bosch , P. Bingley , P. van der Wolf, Design flow management in the NELSIS CAD framework, Proceedings of the 28th conference on ACM/IEEE design automation, p.711-716, June 17-22, 1991, San Francisco, California, United States [doi>10.1145/127601.127756]
	2	J.B. Brockman, and S. W. Director, "The schema-based approach to workflow management," In IEEE Transactions on Computer-Aided Design of lntegrated Circuits and Systems, vol. 14, no. 10, October 1995, pp. 1257-1267.
	3	A. Casotto and A. Sangiovanni-Vincentelli, "Automated design management using traces" In IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 12, August 1993, pp. 1077-1095.
	4	E van den Hamer, and M. A. Treffers, "A data flow based architecture for CAD frameworks," In Proceedings of the IEEE International Conference of Computer-Aided Design, 1991, pp. 482-485.
	5	M. F. Jacome , S. W. Director, Design process management for CAD frameworks, Proceedings of the 29th ACM/IEEE conference on Design automation, p.500-505, June 08-12, 1992, Anaheim, California, United States
	6	Eric W. Johnson , Jay B. Brockman, Incorporating design schedule management into a flow management system, Proceedings of the 32nd ACM/IEEE conference on Design automation, p.82-87, June 12-16, 1995, San Francisco, California, United States [doi>10.1145/217474.217511]
	7	J.J. Moder, C. R. Phillips and E. W. Davis, Project Management with CPM, PERT, and Precedence Diagramming, Van Nostrand Reihold, 1983.
	8	A.B. Pritsker, Modeling and Analysis using Q-Gert Networks, John Wiley and Sons, 1977.
	9	J.L. Rogers, "A knowledge-based tool for multilevel decomposition of a complex design problem", NASA Technical Paper 2903, May 1989.
	10	S.M. Ross, Stochastic Processes, John Wiley and Sons, New York, 1983.
	11	R. E Smith and S. D. Eppinger, "A predictive model of sequential iteration in engineering design", MIT Sloan School of Management Working Paper, No. 3160-90-MS, 1994.
	12	D. V. Steward, "The design structure system: A method for managing the design of complex systems," IEEE Transactions on Engineering Management, vol. EM-28, no. 3, August 1981, pp. 71-74.
	13	C. Yeh, and R. E. Fulton, "A multidisciplinary approach for PWB design process optimization," From the Fourth AIAA Symposium on Multidisciplinary Analysis and Optimization, 1992, pp. 110-118.

CITED BY 2

	E. W. Johnson , J. B. Brockman, Measurement and analysis of sequential design processes, ACM Transactions on Design Automation of Electronic Systems (TODAES), v.3 n.1, p.1-20, Jan. 1998
	E. W. Johnson , J. B. Brockman, Sensitivity analysis of iterative design processes, Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design, p.142-145, November 10-14, 1996, San Jose, California, United States