ACM Home Page
Please provide us with feedback. Feedback
Introspection: a low overhead binding technique during self-diagnosing microarchitecture synthesis
Full text PdfPdf (296 KB)
Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 33rd annual Design Automation Conference table of contents
Las Vegas, Nevada, United States
Pages: 137 - 142  
Year of Publication: 1996
ISBN:0-89791-779-0
Authors
Balakrishnan Iyer  Department of Electrical & Computer Engineering, University of Massachusetts at Amherst, Amherst, MA
Ramesh Karri  Department of Electrical & Computer Engineering, University of Massachusetts at Amherst, Amherst, MA
Sponsors
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
EDAC : Electronic Design Automation Consortium
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 1,   Downloads (12 Months): 2,   Citation Count: 5
Additional Information:

references   cited by   index terms   collaborative colleagues  

Tools and Actions: Request Permissions Request Permissions    Review this Article  
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/240518.240544
What is a DOI?

REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
 
2
 
3
D.M. Blough and A. Nicolau, "Fault Tolerance in Super- Scalar and VLIW Processors", IEEE Workshop on Fault- Tolerant Parallel and Distributed Systems, pp. 193-200, July 1992.
 
4
M.C. McFarland, A.C. Parker, and R. Camposano, "The High-Level Synthesis of Digital Systems", Proc. IEEE, vol. 78, pp. 301-318, Feb. 1990.
 
5
6
7
 
8
 
9
 
10
 
11


Collaborative Colleagues:
Balakrishnan Iyer: colleagues
Ramesh Karri: colleagues