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Why state-of-the-art is not state-of-the-practice (panel)
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Source International Symposium on Software Testing and Analysis archive
Proceedings of the 1996 ACM SIGSOFT international symposium on Software testing and analysis table of contents
San Diego, California, United States
Page: 293  
Year of Publication: 1996
ISBN:0-89791-787-1
Also published in ...
Authors
Richard Denney  Quality Assurance, Landmark Graphics
Dick Kemmerer  Univ. of California, Santa Barbara
Nancy Leveson  Univ. of Washington
Alberto Savoia  Sun Microsystems Labs
Sponsor
SIGSOFT: ACM Special Interest Group on Software Engineering
Publisher
ACM  New York, NY, USA
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Collaborative Colleagues:
Richard Denney: colleagues
Dick Kemmerer: colleagues
Nancy Leveson: colleagues
Alberto Savoia: colleagues