Impulse response fault model and fault extraction for functional level analog circuit diagnosis

ABSTRACT

In this paper, a functional fault model for analog circuit diagnosis is proposed. A faulty module is modeled as a fault-free module in serial or in parallel with a fault module. To extract such a fault module, we adopt an iterative deconvolution technique to deconvolute the impulse response of the fault module from the faulty response. The test results show that with such a fault model and fault extraction technique the diagnostic resolution is improved significantly due to the separation of the fault and the system function. Moreover, such a fault model allows single-module fault tables to be applied to the diagnosis of a multi-module system.

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INDEX TERMS

Primary Classification:
  B. Hardware
  B.7 INTEGRATED CIRCUITS

General Terms:
Theory

Keywords:
Analog Circuit, Testing, Diagnosis