| On adaptive diagnostic test generation |
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International Conference on Computer Aided Design
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Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
table of contents
San Jose, California, United States
Pages: 181 - 184
Year of Publication: 1995
ISBN:0-8186-7213-7
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Authors
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Yiming Gong
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Department of Computer Science, State University of New York, Buffalo, NY
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Sreejit Chakravarty
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Department of Computer Science, State University of New York, Buffalo, NY
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IEEE Computer Society
Washington, DC, USA
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Downloads (6 Weeks): 0, Downloads (12 Months): 5, Citation Count: 1
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ABSTRACT
Adaptive Diagnosis, a paradigm for diagnosis, is defined. A system based on this paradigm, for I_{DDQ} measurement based diagnosis of bridging faults, is reported. Experimental evaluation of the system shows it to be substantially superior to existing systems, especially for larger circuits.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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M. Abramovici and M. A. Breuer, "Multiple Fault Diagnosis of MOS Combinational Networks", IEEE Trans. on Comp., pp.451- 460, June 1980.
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S. Chakravarty, K. Fuchs, and J. Patel, "Evaluation and Generation of I99Q Diagnostic Tests for Bridging Faults in Combinational Circuits", Tech. Rep. 95-11, SUNY at Buffalo, Comp. Science, 1995.
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S. Chakravarty and S. Suresh, "I9 9Q Measurement Based Diagnosis of Bridging Faults in Full Scan Circuits, 7th Int' l Conf. on VLSIDesign, pp. 179-182, 1994.
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Y. Gong and S. Chakravarty, "A Dynamic Diagnostic Test Generation System for I99Q Measurement Based Diagnosis of Bridging Faults", Tech. Rep. 95-18, Comp. Science, SUNY at Buffalo, 1995.
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H. K. Lee and D. S. Ha, "On the Generation of Test Patterns for Combinational Circuits", Tech. Rep. 12-93,Dept. of Electrical Eng., Virginia Polytechnic Institute & State University, 1993.
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Srikanth Venkataraman , Ismed Hartanto , W. Kent Fuchs , Elizabeth M. Rudnick , Sreejit Chakravarty , Janak H. Patel, Rapid diagnostic fault simulation of stuck-at faults in sequential circuits using compact lists, Proceedings of the 32nd ACM/IEEE conference on Design automation, p.133-138, June 12-16, 1995, San Francisco, California, United States
[doi> 10.1145/217474.217519]
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