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Switching activity analysis using Boolean approximation method
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Source International Conference on Computer Aided Design archive
Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design table of contents
San Jose, California, United States
Pages: 20 - 25  
Year of Publication: 1995
ISBN:0-8186-7213-7
Authors
Taku Uchino  Semiconductor DA & Test Engineering Center, Toshiba Corp., 580-1, Horikawa-cho Saiwai-ku Kawasaki 210, Japan
Fumihiro Minami  Semiconductor DA & Test Engineering Center, Toshiba Corp., 580-1, Horikawa-cho Saiwai-ku Kawasaki 210, Japan
Takashi Mitsuhashi  Semiconductor DA & Test Engineering Center, Toshiba Corp., 580-1, Horikawa-cho Saiwai-ku Kawasaki 210, Japan
Nobuyuki Goto  Research and Development Center, Toshiba Corp., 1, Komukai Toshiba-cho Saiwai-ku Kawasaki 210, Japan
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CS : Computer Society
Publisher
IEEE Computer Society  Washington, DC, USA
Bibliometrics
Downloads (6 Weeks): 5,   Downloads (12 Months): 13,   Citation Count: 8
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ABSTRACT

This paper presents a novel algorithm to estimate the signal probability and switching activity at all nodes in a combinational logic circuit under a zero-delay model without constructing global BDDs. By using Taylor expansion technique, the first-order signal correlation effects due to reconvergent fan-out nodes are taken into account. High accuracy is achieved by considering the dependency of the signal probability and switching activity on each primary input. High speed is also achieved by using the incremental approach for probability calculation. Our approach is able to handle large circuits, since it does not need to construct global BDDs for the probability calculation. The analysis of the time complexity and the experimental results show the running time of our approach to be about 100 times shorter than that of the most accurate approach previously proposed and that our approach has comparable accuracy. The error of the total power estimation is about 0.5% on average.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
F.Brglez, P.Pownall, R.Hum, ~Application of testability analysis: from ATPG to critical delay path tracing", Proceeding 1984 International Test Conference, pp.705, 1984.
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S.Ercolani, M.Favalli, M.Damiani, P.Olivo, B.Ricc6, ~Estimate of Signal Probability in Combinational Logic Networks", European Test Conf., pp.132-138, 1989.
 
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CITED BY  8

Collaborative Colleagues:
Taku Uchino: colleagues
Fumihiro Minami: colleagues
Takashi Mitsuhashi: colleagues
Nobuyuki Goto: colleagues