| Extracting RTL models from transistor netlists |
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International Conference on Computer Aided Design
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Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
table of contents
San Jose, California, United States
Pages: 11 - 17
Year of Publication: 1995
ISBN:0-8186-7213-7
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IEEE Computer Society
Washington, DC, USA
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Downloads (6 Weeks): 4, Downloads (12 Months): 22, Citation Count: 3
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ABSTRACT
This paper addresses the problem of deriving a register-transfer level (RTL) model from a transistor-level circuit. Using existing techniques, the transistor-level circuit is converted into a relation that describes the evolution of the signals in the circuit with respect to the simulator clock. This simulation relation is then manipulated to derive the stable behavior of the circuit. Given this stable behavior and information about the clocking scheme, we determine if the circuit is combinational, asynchronous or synchronous. For combinational and synchronous circuits we derive an equivalent register-transfer level model. This development enables full-custom circuit designers to use tools that were till now available only to designers working at the gate-level. The algorithm has been successfully used to characterize several custom designs, as well as the entire AT&T standard-cell library.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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R Agrawal, S. H. Robinson, and T. G. Szymanski. Automatic Modeling of Switch-Level Networks using Partial Orders. In IEEE Transactions on Computer-Aided Design, pages 696-707, July 1990.
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R. E. Bryant. Extraction of Gate Level Models from Transistor Circuits by Four-Valued Symbolic Analysis. In Proceedings of the International Conference on Computer-Aided Design, pages 350-353, 1991.
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R. E. Bryant. Boolean analysis of MOS circuits. In IEEE Transactions on Computer-Aided Design, pages 434-469, July 1992.
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R Deverchere, J. C. Madre, J. B. Guignet, and M. Currat. Functional Abstraction and Formal Proof of Digital Circuits. In The Proceedings of the European Conference on Design Automation, pages 458-462, March 1992.
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T. Kam and R A. Subrahmanyam. Comparing Layouts with HDL models: A Formal Verification Technique. In IEEE Transactions on Computer-Aided Design, pages 503-509, April 1995.
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AT&T Microelectronics. Standard Cells and Function Blocks (0.9 micron CMOS). AT&T, 1990.
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