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A tool for measuring quality of test pattern for LSIs' functional design
Source Asia and South Pacific Design Automation Conference archive
Proceedings of the 1995 Asia and South Pacific Design Automation Conference table of contents
Makuhari, Massa, Chiba, Japan
Article No. 75  
Year of Publication: 1995
ISBN:0-89791-766-9
Authors
Takashi Aoki
Tomoji Toriyama
Kenji Ishikawa
Kennosuke Fukami
Sponsors
IEEE-CAS : Circuits & Systems
IFIP WG 10.2 : IFIP WG 10.2
ISPJ : ISPJ
SIGDA: ACM Special Interest Group on Design Automation
IEICE : Inst of Electronics, Info & Communication Engineers
IFIP WG 10.5 : IFIP WG 10.5
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): n/a,   Downloads (12 Months): n/a,   Citation Count: 0
Additional Information:

index terms   collaborative colleagues  

Tools and Actions: Review this Article  
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/224818.224956
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INDEX TERMS

Primary Classification:
  B. Hardware
  B.6 LOGIC DESIGN

Additional Classification:
  J. Computer Applications
  J.6 COMPUTER-AIDED ENGINEERING
      Subjects: Computer-aided design (CAD)


General Terms:
Design, Measurement, Verification

Collaborative Colleagues:
Takashi Aoki: colleagues
Tomoji Toriyama: colleagues
Kenji Ishikawa: colleagues
Kennosuke Fukami: colleagues

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