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Metric-based transformations for self testable VLSI designs with high test concurrency
Source European Design Automation Conference archive
Proceedings of the conference on European design automation table of contents
Brighton, England
Pages: 136 - 141  
Year of Publication: 1995
ISBN:0-8186-7156-4
Authors
Sponsor
SIGDA: ACM Special Interest Group on Design Automation
Publisher
IEEE Computer Society Press  Los Alamitos, CA, USA
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