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Using the consequence of failures for testing and reliability assessment
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Source Foundations of Software Engineering archive
Proceedings of the 3rd ACM SIGSOFT symposium on Foundations of software engineering table of contents
Washington, D.C., United States
Pages: 81 - 91  
Year of Publication: 1995
ISBN:0-89791-716-2
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Author
Elaine J. Weyuker  AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, NJ
Sponsor
SIGSOFT: ACM Special Interest Group on Software Engineering
Publisher
ACM  New York, NY, USA
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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A. Avritzer and E. J. Weyuker. Estimating the software reliability of smoothly degrading systems, Proceedings IEEE Fifth International Symposium on Software Reliabtlity Engtneermg (ISSRE-94). Nov 1994.
 
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T. A. Thayer, M. Lipow, and E. C. Nelson. Software Reliability. North-Holland, New York, 1978.
 
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