ACM Home Page
Please provide us with feedback. Feedback
Novel verification framework combining structural and OBDD methods in a synthesis environment
Full text PdfPdf (188 KB)
Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 32nd annual ACM/IEEE Design Automation Conference table of contents
San Francisco, California, United States
Pages: 414 - 419  
Year of Publication: 1995
ISBN:0-89791-725-1
Authors
Subdodh M. Reddy  Unisys Corporation and Laboratory for Digital and Computer Systems Research, Department of Computer Science, Texas A&M University, College Station, Texas
Wolfgang Kunz  Fault Tolerant, Computing Laboratory, Max-Planck-Society, University of Potsdam, 14415 Potsdam, Germany
Dhiraj K. Pradhan  Laboratory for Digital and Computer Systems Research, Department of Computer Science, Texas A&M University, College Station, Texas
Sponsors
EDAC : Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 3,   Downloads (12 Months): 19,   Citation Count: 18
Additional Information:

references   cited by   index terms   collaborative colleagues  

Tools and Actions: Request Permissions Request Permissions    Review this Article  
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/217474.328705
What is a DOI?

REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
E. J. Aas, K. Klingsheim, and T. Steen. Quantifying design quality. In Proceedings of EURO ASIC, pages 172-177, 1992.
 
2
C. L. Berman and L. H. Trevillyan. Functional comparison of logic designs for vlsi circuits. In Intl. Test Conference, pages 456-459, 1989.
3
 
4
 
5
F. Brglez and H. Fujiwara. A neutral netlist of 10 combinational benchmark circuits and a target translator in fortran. In Special Session on the 1985 IEEE Intl. Symposium on Circuits ~ Systems, 1985.
 
6
 
7
J. Jain et al. Indexed bdds: Algorithmic advances in techniques to represent to represent and verify boolean functions. Technical Report UT-CERC-TR- JAA-93-02, Comp. Eng. Research Center, 1993.
8
9
 
10
H. Fujiwara and T. Shimono. On the acceleration of test generation algorithms. In Intl. Symposium on Fault-tolerant Computing, pages 98-105, 1983.
 
11
 
12
 
13
W. Kunz and D. K. Pradhan. Recursive learning: A new implication technique for efficient solutions to CAD problems - test, verification, and optimization. In IEEE Trans. on Computer-aided Design of Integrated Circuits and Systems, Vol. 13, No. 9, pages 1143-1157, September, 1994.
 
14
S. Malik, A. Wang, R. Brayton, and A. Sangiovanni- Vincentelli. Logic verification using binary decision diagrams in a logic synthesis environment. In Intl. Conference on Computer-aided Design, pages 6-9, Nov. 1988.
 
15
 
16
 
17
 
18
D. Stoffel, W. Kunz, S. Gerber. Multi-level Logic Synthesis by And-Or-Graphs. Technical Report, MPI-I-95-602, Max-Planck Fault-Tolerant Computing Group, 1995.
 
19
 
20
R. Wei and A. L. Sangiovanni-Vincentelli. Proteus: A logic verification system for combinational circuits. In Intl. Test Conference, 1986.

CITED BY  18

Collaborative Colleagues:
Subdodh M. Reddy: colleagues
Wolfgang Kunz: colleagues
Dhiraj K. Pradhan: colleagues