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Logic clause analysis for delay optimization
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 32nd annual ACM/IEEE Design Automation Conference table of contents
San Francisco, California, United States
Pages: 668 - 672  
Year of Publication: 1995
ISBN:0-89791-725-1
Authors
Berhard Rohfleisch  Institute of Electronic Design Automation, Technical University of Munich, 80290 Munich, Germany
Bernd Wurth  Institute of Electronic Design Automation, Technical University of Munich, 80290 Munich, Germany
Kurt Antreich  Institute of Electronic Design Automation, Technical University of Munich, 80290 Munich, Germany
Sponsors
EDAC : Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 1,   Downloads (12 Months): 6,   Citation Count: 12
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
K. Keutzer, S. Malik, and A. Saldanha, "Is redundancy necessary to reduce delay?," IEEE Transactions on Computer-Aided Design, vol. 10, no. 4, pp. 427-435, 1991.
 
2
A. Saldanha, R. K. Brayton, and A. L. Sangiovanni-Vincentelli, "Circuit structure relations to redundancy and delay," IEEE Transactions on Computer-Aided Design, vol. 13, no. 7, pp. 875-883, 1994.
 
3
K. J. Singh, A. R. Wang, R. K. Brayton, and A. Sangiovanni- Vincentelli, "Timing optimization of combinational logic," IEEE/ACM International Conference on Computer-Aided Design, ICCAD, pp. 282-285, 1988.
 
4
H. Touati, H. Savoj, and R. K. Brayton, "Delay optimization of combinational logic circuits by clustering and partial collapsing," IEEE/ACM International Conference on Computer- Aided Design, ICCAD, pp. 188-191, 1991.
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9
T. Larrabee, "Test pattern generation using boolean satisfiability," IEEE Transactions on Computer-Aided Design, vol. 11, no. 1, pp. 4-15, 1992.
 
10
M. H. Schulz and E. Auth, "Improved deterministic test pattern generation with applications to redundancy identification," IEEE Transactions on Computer-Aided Design, vol. 8, no. 7, pp. 811-816, 1989.
 
11
D. Bryan, F. Brglez, and R. Lisanke, "Redundancy identification and removal," International Workshop on Logic Synthesis, 1989.
 
12
B. Rohfleisch and F. Brglez, "Introduction of permissible bridges with application to logic optimization after technology mapping," The European Design and Test Conference, ED~TC, pp. 87-93, 1994.
 
13
 
14
K.-T. Cheng and L. A. Entrena, "Multi-level logic optimization by redundancy addition and removal," The European Design and Test Conference, ED~TC, pp. 373-377, 1993.
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16
J. A. Waicukauski, E. B. Eichelberger, D. O. Forlenza, E.. Lindbloom, and T. McCarthy, "Fault simulation for structured VLSI," VLSI Systems Design, pp. 20-32, 1985.
 
17
S. T. Chakradhar, V. D. Agrawal, and S. G. Rothweiler, "A transitive closure algorithm for test generation," IEEE Transactions on Computer-Aided Design, vol. 12, no. 7, pp. 1015- 1028, 1993.
 
18
S. Yang, "Logic synthesis and optimization benchmarks user guide, version 3.0," MCNC, Research Triangle Park, N.C. 27709, 1991.
 
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CITED BY  12

Collaborative Colleagues:
Berhard Rohfleisch: colleagues
Bernd Wurth: colleagues
Kurt Antreich: colleagues