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REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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Alauddin Alomary , Takeharu Nakata , Yoshimichi Honma , Masaharu Imai , Nobuyuki Hikichi, An ASIP instruction set optimization algorithm with functional module sharing constraint, Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design, p.526-532, November 07-11, 1993, Santa Clara, California, United States
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U. Bieker, A. Neumann. Using logic programming and coroutining for electronic CAD. 2nd Int. Conf. on the Practical Applications of Prolog, London, April 1994.
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ECLIPSE 3.4 User Manual. ECRC Common Logic Programming System. ECRC GmbH, Arabellastr. 17, Munich, Germany, 1994.
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Design Automation Standards Subcommittee of the IEEE. Draft standard VHDL language reference manual. IEEE Standards Department, 1992.
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G. Krfiger. A tool for hierarchical test generation. IEEE Trans. on Computer Aided Design of Integrated Circuits and Systems, Vol. 10, April 1991.
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C. Liem, P. Paulin. Flexware - A flexible firmware development environment. Proc. European Design & Test Conference, pp. 31-37, 1994.
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S. Bashford, U. Bieker, B. Harking, R. Leupers, P. Marwedel, A. Neumann, D. Voggenauer. The MIMOLA Language - Version 4.1. Technical Report, Computer Science Dpt., University of Dortmund, Sept. 1994.
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Johan Van Praet , Gert Goossens , Dirk Lanneer , Hugo De Man, Instruction set definition and instruction selection for ASIPs, Proceedings of the 7th international symposium on High-level synthesis, p.11-16, May 18-20, 1994, Niagra-on-the-Lake, Ontario, Canada
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Prolog III Reference Manual. PrologIA, Parc Technologique de Luminy - Case 919, 13288 Marseille Cedex 09, France, 1991.
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H. Simonis. Test generation using the constraint logic programming language CHIP. Proc. of the 6th International Conf. on Logic Programming, Lisboa, Portugal, pp. 101 - 112, June 1989.
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D. Svanaes, E. J. Aas. Test generation through logic programming. North- Holland, INTEGRATION, the VLSI journal, No. 2, 1984.
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S. M. Thatte, J. A. Abraham. Test generation for Microprocessors. IEEE Transactions on Computers, Vol. C-29, No. 6, 1980.
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TMS320C2x User's Guide, Rev. B, Texas Instruments, 1990.
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Tom Wilson , Gary Grewal , Ben Halley , Dilip Banerji, An integrated approach to retargetable code generation, Proceedings of the 7th international symposium on High-level synthesis, p.70-75, May 18-20, 1994, Niagra-on-the-Lake, Ontario, Canada
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CITED BY 11
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Indradeep Ghosh , Anand Raghunathan , Niraj K. Jha, Hierarchical test generation and design for testability of ASPPs and ASIPs, Proceedings of the 34th annual conference on Design automation, p.534-539, June 09-13, 1997, Anaheim, California, United States
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