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Residue BDD and its application to the verification of arithmetic circuits
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 32nd annual ACM/IEEE Design Automation Conference table of contents
San Francisco, California, United States
Pages: 542 - 545  
Year of Publication: 1995
ISBN:0-89791-725-1
Author
Shinji Kimura  Graduate School of Information Science, Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma, Nara, 630-01, JAPAN
Sponsors
EDAC : Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 3,   Downloads (12 Months): 8,   Citation Count: 5
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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S. Minato, N. Ishiura, and S. Yajima, "Fast Tautology Checking Using Shared Binary Decision Diagram -Benchmark Results-", in Proc. IFIP International Workshop on Applied Formal Methods for Correct VLSI Design, Nov. 1989, pp. 580-584.
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J. Jain, J. Bitner, J. A. Abraham, and D. S. Fussell, "Functional Partitioning for Verification and Related Problems", in Proc. of the 1992 Brown/MIT Conference, 1992, pp. 210-226.
 
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