System-level design for test of fully differential analog circuits

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System-level design for test of fully differential analog circuits

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Annual ACM IEEE Design Automation Conference archive
Proceedings of the 32nd annual ACM/IEEE Design Automation Conference table of contents

San Francisco, California, United States

Pages: 450 - 454

Year of Publication: 1995

ISBN:0-89791-725-1

Authors

Bapiraju Vinnakota	Department of Electrical Engineering, University of Minnesota, Minneapolis, Minnesota
Ramesh Harjani	Department of Electrical Engineering, University of Minnesota, Minneapolis, Minnesota
Nicholas J. Stessman	Department of Electrical Engineering, University of Minnesota, Minneapolis, Minnesota

Sponsors

EDAC : Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation

Publisher

ACM New York, NY, USA

Bibliometrics

Downloads (6 Weeks): 2, Downloads (12 Months): 9, Citation Count: 1

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

	1	B. Vinnakota and R. Harjani, "The design of analog selfchecking circuits," IEEE International Conference on VLSI Design, 1994.
	2	R. Harjani and B. Vinnakota, "Analog circuit observer blocks," in 12th IEEE VLSI Test Symposium, 1994.
	3	M. Soma, "An experimental approach to analog fault models," in CICC, 1991.
	4	S. W. Director, "Manufacturing-based simulation: An overview," IEEE Circuits and Devices Magazine, vol. 3, September 1987.
	5	B. J. C. L. Wey and G. M. Wierzba, "Built-in self-test (bist) design of large-scale analog circuit networks," in ISCAS, 1989.
	6	J. L. Huertas , A. Rueda , D. Vázquez, Improving the testability of switched-capacitor filters, Analog Integrated Circuits and Signal Processing, v.4 n.3, p.199-213, Nov. 1993 [doi>10.1007/BF01239074]
	7	L. T. Wurtz, "Built-in self-test structure for mixed-mode circuits," IEEE Transactions on Instrumentation and Measurement, vol. 42, February 1993.
	8	L. Milor and V. Visvanathan, "Detection of catastrophic faults in analog integrated circuits," in ICCAD, February 1989.
	9	V. Kolarik, M. Lubaszewski, and B. Courtois, "Towards selfchecking mixed-signal integrated circuits," in European Solid- State Circuits Conference, 1993.
	10	V. Kolarik, M. Lubaszewski, and B. Courtois, "Designing selfexcersising analogue checkers," in IEEE VLSI Test Symposium, 1994.
	11	K. C. Hsieh, P. R. Gray, D. Senderowicz, and D. C. Messerschmidt, "A low-noise chopper-stabilized switched-capacitor filtering technique," IEEE Journal of Solid-State Circuits, vol. SC-16, pp. 708-715, December 1981.
	12	R. Gregorian and G. Temes, Analog MOS Integrated Circuits for Signal Processing. Wiley and Sons, 1986.