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Advanced verification techniques based on learning
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 32nd annual ACM/IEEE Design Automation Conference table of contents
San Francisco, California, United States
Pages: 420 - 426  
Year of Publication: 1995
ISBN:0-89791-725-1
Authors
Jawahar Jain  Fujitsu Laboratories of America, 77 Rio Robles, San Jose CA
Rajarshi Mukherjee  Fujitsu Laboratories of America, 77 Rio Robles, San Jose CA and Dept. of Electrical and Computer Engineering, University of Texas at Austin, Austin TX
Masahiro Fujita  Fujitsu Laboratories of America, 77 Rio Robles, San Jose CA
Sponsors
EDAC : Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 2,   Downloads (12 Months): 13,   Citation Count: 21
Additional Information:

references   cited by   index terms   collaborative colleagues  

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
Berman C. L., Trevyllian L. H., "Functional Comparison of Logic Designs for VLSI Circuits", ICCAD, 1989, pp. 456-459.
 
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Cerny E., Mauras C., "Tautology Checking Using Cross- Controllability and Cross- Observability Relations", ICCAD, 1990, pp. 34-38.
 
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Fujita M., Fujisawa H., Kawato N., "Evaluation and Improvements of Boolean Comparison Method Based on Binary Decision Diagrams", ICCAD, 1988, pp. 2-5.
 
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Malik S. et al., "Logic Verification using Binary Decision Diagrams in a Logic Synthesis Environment", ICCAD, 1988, pp. 6-9.
 
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Mukherjee R., Jain J., Pradhan D. K., "Functional Learning: A new approach to learning in digital circuits", IEEE VLSI Test Symp., pp. 122-127, April 1994.
 
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Jain J., Mukherjee R., Fujita M., "Verification Techniques Based on Functional Learning", Technical Report No. FLA- CPS95-01, Fujitsu Laboratories of America, 1995.
 
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Schulz M., Trischler E., Safert T., "SOCRATES: A highly efficient automatic test pattern generation system", IEEE Trans. on CAD, vol. 7, Jan. 1988, pp. 126-137.
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CITED BY  21

Collaborative Colleagues:
Jawahar Jain: colleagues
Rajarshi Mukherjee: colleagues
Masahiro Fujita: colleagues