Rapid diagnostic fault simulation of stuck-at faults in sequential circuits using compact lists

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Rapid diagnostic fault simulation of stuck-at faults in sequential circuits using compact lists

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Annual ACM IEEE Design Automation Conference archive
Proceedings of the 32nd annual ACM/IEEE Design Automation Conference table of contents

San Francisco, California, United States

Pages: 133 - 138

Year of Publication: 1995

ISBN:0-89791-725-1

Authors

Srikanth Venkataraman	Center for Reliable and High-Performance Computing, University of Illinois, Urbana, IL
Ismed Hartanto	Center for Reliable and High-Performance Computing, University of Illinois, Urbana, IL
W. Kent Fuchs	Center for Reliable and High-Performance Computing, University of Illinois, Urbana, IL
Elizabeth M. Rudnick	Motorola Inc., Austin, TX
Sreejit Chakravarty	State University of New York, Buffalo, NY
Janak H. Patel	Center for Reliable and High-Performance Computing, University of Illinois, Urbana, IL

Sponsors

EDAC : Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation

Publisher

ACM New York, NY, USA

Bibliometrics

Downloads (6 Weeks): 3, Downloads (12 Months): 10, Citation Count: 3

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

	1	P. Camurati et al., "A Diagnostic Test Pattern Generation Algorithm," in Proc. IEEE Intl. Test Conf., pp. 52-58, Sep. 1990.
	2	K. Kubiak , S. Parkes , W. K. Fuchs , R. Saleh, Exact evaluation of diagnostic test resolution, Proceedings of the 29th ACM/IEEE conference on Design automation, p.347-352, June 08-12, 1992, Anaheim, California, United States
	3	Elizabeth M. Rudnick , W. Kent Fuchs , Janak H. Patel, Diagnostic Fault Simulation of Sequential Circuits, Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design, p.178-186, September 20-24, 1992
	4	Paul G. Ryan , W. Kent Fuchs , Irith Pomeranz, Fault dictionary compression and equivalence class computation for sequential circuits, Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design, p.508-511, November 07-11, 1993, Santa Clara, California, United States
	5	Jer Min Jou , Shung-Chih Chen, A fast and memory-efficient diagnostic fault simulation for sequential circuits, Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design, p.723-726, November 06-10, 1994, San Jose, California, United States
	6	Edward M. Reingold , Jurg Nievergelt , Narsingh Deo, Combinatorial Algorithms: Theory and Practice, Prentice Hall College Div, 1977
	7	T. M. Niermann, W. T. Cheng, and J. H. Patel, "PROOFS : A Fast, Memory-Efficient Sequential Circuit Fault Simulator," in IEEE Trans. on CAD, pp. 198-207, Feb. 1992.
	8	F. Brglez, D. Bryan, and K. Kozminski, "Combinational Profiles of Sequential Benchmark Circuits," IEEE Intl. Syrup. on Circuits ~ Systems, pp. 1929-1934, May 1989.
	9	W. T. Cheng and S. Davidson, "Sequential Circuit Test Generator STG Benchmark Results," IEEE Intl. Syrup. on Circuits ~ Systems, pp. 1938-1941, May 1989.
	10	Thomas Niermann , Janak H. Patel, HITEC: a test generation package for sequential circuits, Proceedings of the conference on European design automation, February 25-28, 1991, Amsterdam, The Netherlands

CITED BY 3

	Yiming Gong , Sreejit Chakravarty, On adaptive diagnostic test generation, Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design, p.181-184, November 05-09, 1995, San Jose, California, United States
	Vamsi Boppana , W. Kent Fuchs, Integrated fault diagnosis targeting reduced simulation, Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design, p.681-684, November 10-14, 1996, San Jose, California, United States
	Irith Pomeranz , Srikanth Venkataraman , Sudhakar M. Reddy , Bharath Seshadri, Z-Sets and Z-Detections: Circuit Characteristics that Simplify Fault Diagnosis, Proceedings of the conference on Design, automation and test in Europe, p.10068, February 16-20, 2004