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Statistical estimation of the switching activity in digital circuits
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 31st annual Design Automation Conference table of contents
San Diego, California, United States
Pages: 728 - 733  
Year of Publication: 1994
ISBN:0-89791-653-0
Authors
Michael G. Xakellis  Coordinated Science Lab. & ECE Dept., University of Illinois at Urbana-Champaign, Urbana, Illinois
Farid N. Najm  Coordinated Science Lab. & ECE Dept., University of Illinois at Urbana-Champaign, Urbana, Illinois
Sponsors
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
EDAC : Electronic Design Automation Consortium
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 6,   Downloads (12 Months): 42,   Citation Count: 42
Additional Information:

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
F. Najm, "Transition density: A new measure of activity in digital circuits," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, pp. 310-323, Feb. 1993.
 
2
R. Burch, F. Najm, P. "fang, and T. Trick, "A Monte Carlo approach for power estimation," IEEE Transactions on VLSI Systems, vol. 1, no. 1, pp. 63-71, March 1993.
 
3
I. Miller and J. Freund, Probability and Statistics for Engineers, 3rd edition. Englewood Cliffs, N J: Prentice-Hall, Inc., 1985.
 
4
F. Brglez, P. Pownall, and R. Hum, "Accelerated ATPG and fault grading via testability analysis," IEEE International Symposium on Gircuits and Systems, pp. 695-698, June 1985.
 
5
F. Brglez, D. Bryan and K. Kozminski, "Combinational profiles of sequential benchmark circuits," IEEE International Symposium on Gircuits and Systems, pp. 1929-1934, May 1989.

CITED BY  42

Collaborative Colleagues:
Michael G. Xakellis: colleagues
Farid N. Najm: colleagues