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ProperHITEC: a portable, parallel, object-oriented approach to sequential test generation

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Annual ACM IEEE Design Automation Conference archive
Proceedings of the 31st annual Design Automation Conference table of contents

San Diego, California, United States

Pages: 717 - 721

Year of Publication: 1994

ISBN:0-89791-653-0

Authors

Steven Parkes	Center for Reliable and High-Performance Computing, University of Illinois, 1308 W. Main, Urbana, IL
Prithviraj Banerjee	Center for Reliable and High-Performance Computing, University of Illinois, 1308 W. Main, Urbana, IL
Janak Patel	Center for Reliable and High-Performance Computing, University of Illinois, 1308 W. Main, Urbana, IL

Sponsors

IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
EDAC : Electronic Design Automation Consortium

Publisher

ACM New York, NY, USA

Bibliometrics

Downloads (6 Weeks): 2, Downloads (12 Months): 6, Citation Count: 4

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

	1	S. Parkes, J. A. Chandy, and R Banerjee, "ProperCAD II: A run-time library for portable, parallel, object-oriented programming with applications to VLSI CAD," Tech. Rep. CRHC-93-22/UILU-ENG-93-2250, Center for Reliable and High-performance Computing, University of Illinois, Dec. 1993.
	2	Gul Agha, Actors: a model of concurrent computation in distributed systems, MIT Press, Cambridge, MA, 1986
	3	S. Chandra and J. H. Patel, "Test generation in a parallel processing environment," Proc. Int. Conf. Comp. Design (ICCD-88), pp. 11-14, Oct. 1988.
	4	Srinivas Patil , Prithviraj Banerjee , Janak H. Patel, Parallel test generation for sequential circuits on general-purpose multiprocessors, Proceedings of the 28th conference on ACM/IEEE design automation, p.155-159, June 17-22, 1991, San Francisco, California, United States [doi>10.1145/127601.127651]
	5	P. Agrawal , V. D. Agrawal , J. Villoldo, Sequential circuit test generation on a distributed system, Proceedings of the 30th international conference on Design automation, p.107-111, June 14-18, 1993, Dallas, Texas, United States [doi>10.1145/157485.164762]
	6	V. Nageshwara Rao , Vipin Kumar, Parallel depth first search. Part I. implementation, International Journal of Parallel Programming, v.16 n.6, p.479-499, December 1987 [doi>10.1007/BF01389000]
	7	A. Motohara, K. Nishimura, H. Fujiwara, and I. Shirakawa, "A parallel scheme for test-pattern generation," in Digest of Papers, International Conference on Computer-AidedDesign, pp. 156-159,Nov. 1986.
	8	S. Patil and E Banerjee, "A parallel branch and bound approach to test generation," IEEE Transactions on Computer Aided Design, vol. 9, pp. 313-322, Mar. 1990.
	9	S. Arvindam, V. Kumar, V. N. Rao, and V. Singh, "Automatic test pattern generation on parallel processors," tech. rep., Computer Science Dept, Univ. of Minnesota, May 1990.
	10	Balkrishna Ramkumar , Prithviraj Banerjee, Portable parallel test generation for sequential circuits, Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design, p.220-223, November 1992, Santa Clara, California, United States
	11	W. Fenton, B. Ramkumar, V. A. Saletore, A. B. Sinha, and L. V. Kal6, "Supporting machine independent programming on diverse parallel architecturs," in Proceedings of the International Conference on Parallel Processing, Aug. 1991.
	12	R. H. Bell, Jr., R. H. Klenke, J. H. Aylor, and R. D. Williams, "Results of a topologically partitioned parallel automatic test pattern generation system on a distributed-memory multiprocessor," ASIC '92, Sept. 1992.
	13	Thomas Niermann , Janak H. Patel, HITEC: a test generation package for sequential circuits, Proceedings of the conference on European design automation, February 25-28, 1991, Amsterdam, The Netherlands
	14	S. Patil and E Banerjee, "Performance trade-offs in a parallel test generation/fault simulation environment,"IEEE Transactions on Computer- Aided Design, vol. 10, pp. 1542-1558,Dec. 1991.
	15	Andrew A. Chien, Concurrent aggregates: supporting modularity in massively parallel programs, MIT Press, Cambridge, MA, 1993

CITED BY 4

	Steven Parkes , John A. Chandy , Prithviraj Banerjee, A library-based approach to portable, parallel, object-oriented programming: interface, implementation, and application, Proceedings of the 1994 ACM/IEEE conference on Supercomputing, November 14-18, 1994, Washington, D.C.
	Steven Parkes , John A. Chandy , Prithviraj Banerjee, A library-based approach to portable, parallel, object-oriented programming198383: interface, implementation, and application, Proceedings of the 1994 conference on Supercomputing, p.69-78, December 1994, Washington, D.C., United States
	Venkatram Krishnaswamy , Prithviraj Banerjee, Actor based parallel VHDL simulation using time warp, ACM SIGSIM Simulation Digest, v.26 n.1, p.135-142, July 1996
	Peter A. Krauss , Andreas Ganz , Kurt J. Antreich, Distributed Test Pattern Generation for Stuck-At Faults in Sequential Circuits, Journal of Electronic Testing: Theory and Applications, v.11 n.3, p.227-245, Dec. 1997