Generating test suites for software load testing

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Generating test suites for software load testing

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International Symposium on Software Testing and Analysis archive
Proceedings of the 1994 ACM SIGSOFT international symposium on Software testing and analysis table of contents

Seattle, Washington, United States

Pages: 44 - 57

Year of Publication: 1994

ISBN:0-89791-683-2

Authors

Alberto Avritzer	AT&T Bell Labs, Murray Hill, NJ
Elaine J. Weyuker	AT&T Bell Labs, Murray Hill, NJ; and New York Univ., New York, NY

Sponsor

SIGSOFT: ACM Special Interest Group on Software Engineering

Publisher

ACM New York, NY, USA

Bibliometrics

Downloads (6 Weeks): 7, Downloads (12 Months): 48, Citation Count: 4

Additional Information:

references cited by index terms review collaborative colleagues

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

	1	Alberto Avritzer , Brian Larson, Load testing software using deterministic state testing, Proceedings of the 1993 ACM SIGSOFT international symposium on Software testing and analysis, p.82-88, June 28-30, 1993, Cambridge, Massachusetts, United States
	2	R. DeMillo, R. Lipton, and F. Sayward. Hints on test data selection: help for the practicing programmer. Computer, April 1978, pp.34-41.
	3	J. W. Duran and S. C. Ntafos. An evaluation of random testing. IEEE Transactions on Software Engineering, Vol SE-10, No 4, July 1984, pp.438-444.
	4	P. G. Frankl , E. J. Weyuker, Provable Improvements on Branch Testing, IEEE Transactions on Software Engineering, v.19 n.10, p.962-975, October 1993 [doi>10.1109/32.245738]
	5	R. Hamlet and R. Taylor. Partition testing does not inspire confidence. In Proc. Second Workshop on Software Testing, Verification, and Analysis, Banff, Canada, July 1988, pp.206-215.
	6	Leonard Kleinrock, Theory, Volume 1, Queueing Systems, Wiley-Interscience, 1975
	7	John D. Musa, Operational Profiles in Software-Reliability Engineering, IEEE Software, v.10 n.2, p.14-32, March 1993 [doi>10.1109/52.199724]
	8	S. N. Weiss , E. J. Weyuker, An Extended Domain-Based Model of Software Reliability, IEEE Transactions on Software Engineering, v.14 n.10, p.1512-1524, October 1988 [doi>10.1109/32.6196]
	9	Elaine J. Weyuker , Bingchiang Jeng, Analyzing Partition Testing Strategies, IEEE Transactions on Software Engineering, v.17 n.7, p.703-711, July 1991 [doi>10.1109/32.83906]

CITED BY 4

	Cheer-Sun D. Yang , Lori L. Pollock, Towards a structural load testing tool, ACM SIGSOFT Software Engineering Notes, v.21 n.3, p.201-208, May 1996
	Elaine J. Weyuker, Using the consequence of failures for testing and reliability assessment, ACM SIGSOFT Software Engineering Notes, v.20 n.4, p.81-91, Oct. 1995
	Alberto Avritzer , Johannes P. Ros , Elaine J. Weyuker, Estimating the CPU utilization of a rule-based system, ACM SIGSOFT Software Engineering Notes, v.29 n.1, January 2004
	Jian Zhang , S. C. Cheung, Automated test case generation for the stress testing of multimedia systems, Software—Practice & Experience, v.32 n.15, p.1411-1435, December 2002

INDEX TERMS

Primary Classification:
D. Software
D.2 SOFTWARE ENGINEERING
D.2.5 Testing and Debugging
Subjects: Testing tools (e.g., data generators, coverage testing)

Additional Classification:
C. Computer Systems Organization
C.2 COMPUTER-COMMUNICATION NETWORKS
C.2.0 General
Subjects: Data communications

D. Software
D.2 SOFTWARE ENGINEERING
D.2.4 Software/Program Verification
Subjects: Correctness proofs

G. Mathematics of Computing
G.3 PROBABILITY AND STATISTICS
Subjects: Probabilistic algorithms (including Monte Carlo)

General Terms:
Algorithms, Design, Performance

REVIEW

"Boris Beizer : Reviewer"

The authors propose, analyze, and provide experimental support for three new black-box testing strategies for systems that can be described by a Markov model. Although such models apply to systems other than telecommunications systems, the pap more...

Collaborative Colleagues:

Alberto Avritzer: colleagues

Elaine J. Weyuker: colleagues

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