A self-adaptive test framework for concurrent programs

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A self-adaptive test framework for concurrent programs

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International Conference on Management of Emergent Digital EcoSystems archive
Proceedings of the International Conference on Management of Emergent Digital EcoSystems table of contents

France

DEMONSTRATION SESSION: Demo/Poster (DP) table of contents

Article No. 72

Year of Publication: 2009

ISBN:978-1-60558-829-2

Authors

Manna Wu	Zhejiang University, Hangzhou, China
Bo Zhou	Zhejiang University, Hangzhou, China
Wei Shi	Zhejiang University, Hangzhou, China

Sponsor

: The French Chapter of ACM Special Interest Group on Applied Computing

Publisher

ACM New York, NY, USA

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ABSTRACT

In this paper, we describe a new test framework for concurrent programs. Testing on concurrent programs remains difficult due to the non-deterministic nature of concurrent programs. Approaches are proposed to surmount this difficulty. However, few of them are really effective. A new self-adaptive test framework is proposed to alleviate this problem, since it is impossible to solve it completely. This framework which is based on the study of concurrent test points tests each concurrent program like a circuit, while concurrent test points like components of the circuit. The original reason of concurrent bugs stems from the resource sharing among multiple processes or threads. Therefore, a controller is introduced in the framework to increasingly intensify resource competition via test data controlling, aiming to trigger concurrent bugs' emerging sooner once they exist.

REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

	1	Jun Chen, Steve McDonald. 2008. Towards a Better Collaboration of Static and Dynamic Analyses for Testing Concurrent Programs. In Proceedings of the 6th workshop on Parallel and distributed systems (Seattle, Washington, USA, July 20--21, 2008). PADTAD'08, ACM Press, New York, NY, 1--9. DOI= http://doi.acm.org/10.1145/1390841.1390849
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