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Configuration of VLSI Arrays in the Presence of Defects
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Volume 31 ,  Issue 4  (October 1984) table of contents
Pages: 694 - 717  
Year of Publication: 1984
ISSN:0004-5411
Authors
Jonathan W. Greene  Information Systems Laboratory, Stanford University, Stanford, CA
Abbas El Gamal  Information Systems Laboratory, Stanford University, Stanford, CA
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 1,   Downloads (12 Months): 32,   Citation Count: 19
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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CITED BY  19


REVIEW

"Sekharipuram Subramaniam Ravi : Reviewer"

Recent developments in VLSI technology have made it possible to realize entire digital systems on a single wafer. Such a realization is referred to as wafer scale integration [1]. This approach is particularly suitable for memories an  more...

Collaborative Colleagues:
Jonathan W. Greene: colleagues
Abbas El Gamal: colleagues