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Software-assisted hardware reliability: abstracting circuit-level challenges to the software stack
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Proceedings of the 46th Annual Design Automation Conference table of contents
San Francisco, California
SESSION: Scheduling, allocation and reliability table of contents
Pages 788-793  
Year of Publication: 2009
ISBN:978-1-60558-497-3
Authors
Vijay Janapa Reddi  Harvard University, Cambridge
Meeta S. Gupta  Harvard University, Cambridge
Michael D. Smith  Harvard University, Cambridge
Gu-yeon Wei  Harvard University, Cambridge
David Brooks  Harvard University, Cambridge
Simone Campanoni  Politecnico di Milano, Milano, Italy
Sponsors
EDAC : Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CAS : Circuits & Systems
Publisher
ACM  New York, NY, USA
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ABSTRACT

Power constrained designs are becoming increasingly sensitive to supply voltage noise. We propose a hardware-software collaborative approach to enable aggressive operating margins: a checkpoint-recovery mechanism corrects margin violations, while a run-time software layer reschedules the program's instruction stream to prevent recurring margin crossings at the same program location. The run-time layer removes 60% of these events with minimal overhead, thereby significantly improving overall performance.


REFERENCES

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