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A voltage-scalable & process variation resilient hybrid SRAM architecture for MPEG-4 video processors
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 46th Annual Design Automation Conference table of contents
San Francisco, California
SESSION: Embedded system design for low-power table of contents
Pages 670-675  
Year of Publication: 2009
ISBN:978-1-60558-497-3
Authors
Ik Joon Chang  Purdue University, West Lafayette, IN
Debabrata Mohapatra  Purdue University, West Lafayette, IN
Kaushik Roy  Purdue University, West Lafayette, IN
Sponsors
EDAC : Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CAS : Circuits & Systems
Publisher
ACM  New York, NY, USA
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ABSTRACT

We present a voltage-scalable and process-variation resilient memory architecture, suitable for MPEG-4 video processors such that power dissipation can be traded for graceful degradation in "quality". The key innovation in our proposed work is a hybrid memory array, which is mixture of conventional 6T and 8T SRAM bit-cells. The fundamental premise of our approach lies in the fact that human visual system (HVS) is mostly sensitive to higher order bits of luminance pixels in video data. We implemented a preferential storage policy in which the higher order luma bits are stored in robust 8T bit-cells while the lower order bits are stored in conventional 6T bit-cells. This facilitates aggressive scaling of supply voltage in memory as the important luma bits, stored in 8T bit-cells, remain relatively unaffected by voltage scaling. The not-so-important lower order luma bits, stored in 6T bit-cells, if affected, contribute insignificantly to the overall degradation in output video quality. Simulation results show average power savings of up to 56%, in the hybrid memory array compared to the conventional 6T SRAM array implemented in 65nm CMOS. The area overhead and maximum output quality degradation (PSNR) incurred were 11.5% and 0.56 dB, respectively.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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