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Non-cycle-accurate sequential equivalence checking
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 46th Annual Design Automation Conference table of contents
San Francisco, California
SESSION: Jumping the high-level verification hurdle table of contents
Pages 460-465  
Year of Publication: 2009
ISBN:978-1-60558-497-3
Authors
Pankaj Chauhan  Calypto Design Systems, Inc., Santa Clara, CA
Deepak Goyal  Calypto Design Systems, Inc., Santa Clara, CA
Gagan Hasteer  Calypto Design Systems, Inc., Santa Clara, CA
Anmol Mathur  Calypto Design Systems, Inc., Santa Clara, CA
Nikhil Sharma  Calypto Design Systems, Inc., Santa Clara, CA
Sponsors
EDAC : Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CAS : Circuits & Systems
Publisher
ACM  New York, NY, USA
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ABSTRACT

We present a novel technique for Sequential Equivalence Checking (SEC) between non-cycle-accurate designs. The problem is routinely encountered in verifying the correctness of a system-level model versus an RTL design which has been derived from the former either manually or through high-level synthesis. The existing state-of-the-art in formal verification/SEC does not provide an efficient mechanism to perform such an equivalence check. Our technique reduces the SEC problem to a cycle-accurate equivalence-checking problem by constructing a pair of normalized cycle-accurate designs from the original designs, on which standard equivalence-checking techniques can then be deployed. We report the results of deploying our techniques on several industrial examples.


REFERENCES

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